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Cited by 425

The DOI matches its Crossref record; 18 of the 18 references it cites were found in a registry or an index.

Lifetime of the zero-voltage state in Josephson tunnel junctions

Fulton, T. A., Dunkleberger, L. N.·1974·Physical Review B
DOI 10.1103/physrevb.9.4760
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Abstract

We describe an experimental investigation of fluctuations in the measured value of the critical current in Josephson tunnel junctions. The lifetime $\ensuremath{\tau}$ of the zero-voltage state against spontaneous transitions to a nonzero-voltage state is derived from these measurements. The range of $\ensuremath{\tau}$ covered by these measurements runs from ${10}^{\ensuremath{-}1}$ to ${10}^{\ensuremath{-}7}$ sec, with $\ensuremath{\tau}$ decreasing approximately exponentially with increasing current bias. Both thermal-noise-limited and extrinsic-noise-limited situations have been observed. In associated experiments the maximum critical current of these Sn-Sn-oxide-Sn juntions is found to be reduced from the value predicted by weak-coupling theory by a factor of $\ensuremath{\approx}0.92$, presumably by strong-coupling effects.

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Metadata

Authors
Fulton, T. A., & Dunkleberger, L. N.
Venue
Physical Review B
Publisher
American Physical Society (APS)
Published
1974-06-01
Volume
9
Issue
11
Pages
4760-4768
ISSN
0556-2805 (ISSN-L)
DOI
10.1103/physrevb.9.4760
OpenAlex
W2024730145
Cited by
425
References
18
FWCI
0.87
Type
journal article
Language
en
Open access
closed

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