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Cited by 246

The DOI matches its Crossref record; 7 of the 7 references it cites were found in a registry or an index.

Randomized Benchmarking and Process Tomography for Gate Errors in a Solid-State Qubit

Open access
Chow, J. M., Gambetta, J. M., Tornberg, L., Koch, Jens, Bishop, Lev S., Houck, A. A., Johnson, B. R., Frunzio, L., Girvin, S. M., Schoelkopf, R. J.·2009·Physical Review Letters

Abstract

We present measurements of single-qubit gate errors for a superconducting qubit. Results from quantum process tomography and randomized benchmarking are compared with gate errors obtained from a double pi pulse experiment. Randomized benchmarking reveals a minimum average gate error of 1.1+/-0.3% and a simple exponential dependence of fidelity on the number of gates. It shows that the limits on gate fidelity are primarily imposed by qubit decoherence, in agreement with theory.

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Crossref · 10.1103/physrevlett.102.090502

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Metadata

Authors
Chow, J. M., Gambetta, J. M., Tornberg, L., Koch, J., Bishop, L. S., Houck, A. A., Johnson, B. R., Frunzio, L., Girvin, S. M., & Schoelkopf, R. J.
Venue
Physical Review Letters
Published
2009-03-05
Volume
102
Issue
9
Pages
090502-090502
ISSN
  • 0031-9007 (ISSN-L)
  • 1079-7114
OpenAlex
W2160877306
Cited by
246
References
7
FWCI
19.16
Type
journal article
Language
en
Open access
green

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CoChat. (2026). Citation check: Randomized Benchmarking and Process Tomography for Gate Errors in a Solid-State Qubit. https://app.cochat.ai/papers/10.1103/physrevlett.102.090502
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Chow, J. M., Gambetta, J. M., Tornberg, L., Koch, J., Bishop, L. S., Houck, A. A., Johnson, B. R., Frunzio, L., Girvin, S. M., & Schoelkopf, R. J. (2009). Randomized Benchmarking and Process Tomography for Gate Errors in a Solid-State Qubit. Physical Review Letters. https://doi.org/10.1103/physrevlett.102.090502

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