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Cited by 454

The DOI matches its Crossref record; 42 of the 42 references it cites were found in a registry or an index.

Unraveling the Intrinsic and Robust Nature of van Hove Singularities in Twisted Bilayer Graphene by Scanning Tunneling Microscopy and Theoretical Analysis

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Brihuega, I., Mallet, P., González-Herrero, H., Trambly de Laissardière, G., Ugeda, M. M., Magaud, L., Gómez-Rodríguez, J. M., Ynduráin, F., Veuillen, J.-Y.·2012·Physical Review Letters

Abstract

Extensive scanning tunneling microscopy and spectroscopy experiments complemented by first-principles and parametrized tight binding calculations provide a clear answer to the existence, origin, and robustness of van Hove singularities (vHs) in twisted graphene layers. Our results are conclusive: vHs due to interlayer coupling are ubiquitously present in a broad range (from 1° to 10°) of rotation angles in our graphene on 6H-SiC(000-1) samples. From the variation of the energy separation of the vHs with the rotation angle we are able to recover the Fermi velocity of a graphene monolayer as well as the strength of the interlayer interaction. The robustness of the vHs is assessed both by experiments, which show that they survive in the presence of a third graphene layer, and by calculations, which test the role of the periodic modulation and absolute value of the interlayer distance. Finally, we clarify the role of the layer topographic corrugation and of electronic effects in the apparent moiré contrast measured on the STM images.

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Metadata

Authors
Brihuega, I., Mallet, P., González-Herrero, H., Trambly de Laissardière, G., Ugeda, M. M., Magaud, L., Gómez-Rodríguez, J. M., Ynduráin, F., & Veuillen, J.-Y.
Venue
Physical Review Letters
Published
2012-11-08
Volume
109
Issue
19
Pages
196802-196802
ISSN
  • 0031-9007 (ISSN-L)
  • 1079-7114
OpenAlex
W1514210581
Cited by
454
References
42
FWCI
9.85
Type
journal article
Language
en
Open access
bronze

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CoChat. (2026). Citation check: Unraveling the Intrinsic and Robust Nature of van Hove Singularities in Twisted Bilayer Graphene by Scanning Tunneling Microscopy and Theoretical Analysis. https://app.cochat.ai/papers/10.1103/physrevlett.109.196802
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Brihuega, I., Mallet, P., González-Herrero, H., Trambly de Laissardière, G., Ugeda, M. M., Magaud, L., Gómez-Rodríguez, J. M., Ynduráin, F., & Veuillen, J.-Y. (2012). Unraveling the Intrinsic and Robust Nature of van Hove Singularities in Twisted Bilayer Graphene by Scanning Tunneling Microscopy and Theoretical Analysis. Physical Review Letters. https://doi.org/10.1103/physrevlett.109.196802

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