The DOI matches its Crossref record; 16 of the 16 references it cites were found in a registry or an index.
Nonmetallic Conduction in Electron Inversion Layers at Low Temperatures
Abstract
We have measured the resistance of electron inversion layers in Si metal-oxide-semiconductor field-effect transistors at low temperatures (\ensuremath{\sim}50 mK) and low electric fields (\ensuremath{\sim}0.1 V/m). At low values of ${R}_{\ensuremath{\square}}$ we observe logarithmic dependences of the resistance on both temperature and applied electric field which scale only on ${R}_{\ensuremath{\square}}$. We observe a gradual transition to an exponential dependence at ${R}_{\ensuremath{\square}}\ensuremath{\gtrsim}10$ k\ensuremath{\Omega}. The logarithmic dependences agree qualitatively but not quantitatively with current theories of localization.
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Citations
Cites
Scaling Theory of Localization: Absence of Quantum Diffusion in Two Dimensions
Abrahams, E., Anderson, P. W., Licciardello, D. C., & Ramakrishnan, T. V. (1979) · Physical Review Letters · doi:10.1103/physrevlett.42.673 · Cited by 6,134
Maximum Metallic Resistance in Thin Wires
Thouless, D. J. (1977) · Physical Review Letters · doi:10.1103/physrevlett.39.1167 · Cited by 1,092
Possible Explanation of Nonlinear Conductivity in Thin-Film Metal Wires
Anderson, P. W., Abrahams, E., & Ramakrishnan, T. V. (1979) · Physical Review Letters · doi:10.1103/physrevlett.43.718 · Cited by 543
Nonmetallic Conduction in Thin Metal Films at Low Temperatures
Dolan, G. J., & Osheroff, D. D. (1979) · Physical Review Letters · doi:10.1103/physrevlett.43.721 · Cited by 327
Mott, N. F., Pepper, M., Pollitt, S., Wallis, R. H., & Adkins, C. J. (1975) · Proceedings of the Royal Society of London. A. Mathematical and Physical Sciences · doi:10.1098/rspa.1975.0131 · Cited by 300
Two-Dimensional Electrical Conductivity in Quench-Condensed Metal Films
Dynes, R. C., Garno, J. P., & Rowell, J. M. (1978) · Physical Review Letters · doi:10.1103/physrevlett.40.479 · Cited by 218
Self-citationReal-Space Scaling Studies of Localization
Lee, P. A. (1979) · Physical Review Letters · doi:10.1103/physrevlett.42.1492 · Cited by 120
Allen, S. J., Tsui, D. C., & DeRosa, F. (1975) · Physical Review Letters · doi:10.1103/physrevlett.35.1359 · Cited by 115
Self-citationDisorder-induced carrier localization in silicon surface inversion layers
Arnold, E. (1974) · Applied Physics Letters · doi:10.1063/1.1655369 · Cited by 105
Mott-Anderson Localization in the Two-Dimensional Band Tail of Si Inversion Layers
Tsui, D. C., & Allen, S. J. (1974) · Physical Review Letters · doi:10.1103/physrevlett.32.1200 · Cited by 100
Self-citation
Cited by
Electronic properties of two-dimensional systems
Ando, T., Fowler, A. B., & Stern, F. (1982) · Reviews of Modern Physics · doi:10.1103/revmodphys.54.437 · Cited by 7,455
Two-Dimensional Magnetotransport in the Extreme Quantum Limit
Tsui, D. C., Stormer, H. L., & Gossard, A. C. (1982) · Physical Review Letters · doi:10.1103/physrevlett.48.1559 · Cited by 4,788
Self-citationSupersymmetry and theory of disordered metals
Efetov, K. B. (1983) · Advances in Physics · doi:10.1080/00018738300101531 · Cited by 1,249
Magnetoresistance and Hall effect in a disordered two-dimensional electron gas
Altshuler, B. L., Khmel'nitzkii, D., Larkin, A. I., & Lee, P. A. (1980) · Physical Review B · doi:10.1103/physrevb.22.5142 · Cited by 1,117
New method for a scaling theory of localization
Anderson, P. W., Thouless, D. J., Abrahams, E., & Fisher, D. S. (1980) · Physical Review B · doi:10.1103/physrevb.22.3519 · Cited by 1,015
Metadata
- Authors
- Bishop, D. J., Tsui, D. C., & Dynes, R. C.
- Venue
- Physical Review Letters
- Publisher
- American Physical Society (APS)
- Published
- 1980-04-28
- Volume
- 44
- Issue
- 17
- Pages
- 1153-1156
- ISSN
- 0031-9007 (ISSN-L)
- OpenAlex
- W2091216206
- Cited by
- 294
- References
- 16
- FWCI
- 28.39
- Type
- journal article
- Language
- en
- Open access
- closed
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Contains information from the Semantic Scholar Academic Graph Datasets, made available under the ODC Attribution License (ODC-BY 1.0).
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