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Atomic Force Microscope
Open accessAbstract
The scanning tunneling microscope is proposed as a method to measure forces as small as ${10}^{\ensuremath{-}18}$ N. As one application for this concept, we introduce a new type of microscope capable of investigating surfaces of insulators on an atomic scale. The atomic force microscope is a combination of the principles of the scanning tunneling microscope and the stylus profilometer. It incorporates a probe that does not damage the surface. Our preliminary results in air demonstrate a lateral resolution of 30 \AA{}A and a vertical resolution less than 1 \AA{}.
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Cited by
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Grieshaber, D., MacKenzie, R., Vörös, J., & Reimhult, E. (2008) · Sensors · doi:10.3390/s80314000 · Cited by 2,329
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Metadata
- Authors
- Binnig, G., Quate, C. F., & Gerber, C.
- Venue
- Physical Review Letters
- Publisher
- American Physical Society (APS)
- Published
- 1986-03-03
- Volume
- 56
- Issue
- 9
- Pages
- 930-933
- ISSN
- 0031-9007 (ISSN-L)
- OpenAlex
- W3150248096
- Cited by
- 14,762
- References
- 0
- FWCI
- 47.35
- Type
- journal article
- Language
- en
- Open access
- bronze
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- CoChat. (2026). Citation check: Atomic Force Microscope. https://app.cochat.ai/papers/10.1103/physrevlett.56.930
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- Binnig, G., Quate, C. F., & Gerber, C. (1986). Atomic Force Microscope. Physical Review Letters. https://doi.org/10.1103/physrevlett.56.930
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Contains information from the Semantic Scholar Academic Graph Datasets, made available under the ODC Attribution License (ODC-BY 1.0).
Semantic Scholar’s data is described in: Kinney, R., et al. (2023). The Semantic Scholar Open Data Platform. arXiv:2301.10140.
