The DOI matches its Crossref record; 1 of the 1 references it cites were found in a registry or an index.
Observation of Molecular Layering in Thin Liquid Films Using X-Ray Reflectivity
Abstract
We report the direct observation of internal layering in thin ( $\ensuremath{\sim}45--90\AA{}$) liquid films of nearly spherical, nonpolar molecules, tetrakis(2-ethylhexoxy)silane, using synchrotron x-ray reflectivity. The Patterson functions have secondary maxima indicating layer formation, and model-independent fitting to the reflectivity data shows that there are three electron density oscillations near the solid-liquid interface, with a period of $\ensuremath{\sim}10\AA{}$ (consistent with the molecular dimensions). The oscillation amplitude has a strong inverse dependence on the substrate surface roughness.
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Citations
Cites
Dynamic Properties of Molecularly Thin Liquid Films
Israelachvili, J. N., McGuiggan, P. M., & Homola, A. M. (1988) · Science · doi:10.1126/science.240.4849.189 · Cited by 664
Cited by
Anomalous thermal conductivity enhancement in nanotube suspensions
Choi, S. U. S., Zhang, Z. G., Yu, W., Lockwood, F. E., & Grulke, E. A. (2001) · Applied Physics Letters · doi:10.1063/1.1408272 · Cited by 2,769
Molecular-Scale Density Oscillations in Water Adjacent to a Mica Surface
Cheng, L., Fenter, P., Nagy, K. L., Schlegel, M. L., & Sturchio, N. C. (2001) · Physical Review Letters · doi:10.1103/physrevlett.87.156103 · Cited by 465
Metadata
- Authors
- Yu, C.-J., Richter, A. G., Datta, A., Durbin, M. K., & Dutta, P.
- Venue
- Physical Review Letters
- Publisher
- American Physical Society (APS)
- Published
- 1999-03-15
- Volume
- 82
- Issue
- 11
- Pages
- 2326-2329
- ISSN
- 0031-9007 (ISSN-L)
- 1079-7114
- OpenAlex
- W2057981488
- Cited by
- 231
- References
- 1
- FWCI
- 16.60
- Type
- journal article
- Language
- en
- Open access
- closed
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- Yu, C.-J., Richter, A. G., Datta, A., Durbin, M. K., & Dutta, P. (1999). Observation of Molecular Layering in Thin Liquid Films Using X-Ray Reflectivity. Physical Review Letters. https://doi.org/10.1103/physrevlett.82.2326
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