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Cited by 323

The DOI matches its Crossref record; 10 of the 10 references it cites were found in a registry or an index.

Roughness Evolution of Ion Sputtered Rotating InP Surfaces: Pattern Formation and Scaling Laws

Frost, F., Schindler, A., Bigl, F.·2000·Physical Review Letters

Abstract

The topography evolution of simultaneously rotated and Ar (+) ion sputtered InP surfaces was studied using scanning force microscopy. For certain sputter conditions, the formation of a highly regular hexagonal pattern of close-packed mounds was observed with a characteristic spatial wavelength which increases with sputter time t according to lambda approximately t(gamma) with gamma approximately 0.26. Based on the analysis of the dynamic scaling behavior of the surface roughness, the evolution of the surface topography will be discussed within the limits of existing models for surface erosion by ion sputtering.

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Crossref · 10.1103/physrevlett.85.4116

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Metadata

Authors
Frost, F., Schindler, A., & Bigl, F.
Venue
Physical Review Letters
Published
2000-11-06
Volume
85
Issue
19
Pages
4116-4119
ISSN
  • 0031-9007 (ISSN-L)
  • 1079-7114
OpenAlex
W2089351811
Cited by
323
References
10
FWCI
13.03
Type
journal article
Language
en
Open access
closed

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CoChat. (2026). Citation check: Roughness Evolution of Ion Sputtered Rotating InP Surfaces: Pattern Formation and Scaling Laws. https://app.cochat.ai/papers/10.1103/physrevlett.85.4116
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Frost, F., Schindler, A., & Bigl, F. (2000). Roughness Evolution of Ion Sputtered Rotating InP Surfaces: Pattern Formation and Scaling Laws. Physical Review Letters. https://doi.org/10.1103/physrevlett.85.4116

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Contains information from the Semantic Scholar Academic Graph Datasets, made available under the ODC Attribution License (ODC-BY 1.0).

Semantic Scholar’s data is described in: Kinney, R., et al. (2023). The Semantic Scholar Open Data Platform. arXiv:2301.10140.