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Cited by 271

The DOI matches its Crossref record; 12 of the 12 references it cites were found in a registry or an index.

Mobility of the Doped Holes and the Antiferromagnetic Correlations in Underdoped High-TcCuprates

Open access
Ando, Yoichi, Lavrov, A. N., Komiya, Seiki, Segawa, Kouji, Sun, X. F.·2001·Physical Review Letters

Abstract

The emergence and the evolution of the metallic charge transport in the ${\mathrm{La}}_{2\ensuremath{-}x}{\mathrm{Sr}}_{x}{\mathrm{CuO}}_{4}$ system from lightly to optimally doped samples ( $x\phantom{\rule{0ex}{0ex}}=\phantom{\rule{0ex}{0ex}}0.01--0.17$) are studied. We demonstrate that in high-quality single crystals the in-plane resistivity shows a metallic behavior for all values of $x$ at moderate temperatures and that the hole mobility at 300 K changes only by a factor of 3 from $x\phantom{\rule{0ex}{0ex}}=\phantom{\rule{0ex}{0ex}}0.01$ to 0.17, where its $x$ dependence is found to be intriguingly similar to that of the inverse antiferromagnetic correlation length. We discuss an incoherent-metal picture and a charged-stripe scenario as candidates to account for these peculiar features.

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Metadata

Authors
Ando, Y., Lavrov, A. N., Komiya, S., Segawa, K., & Sun, X. F.
Venue
Physical Review Letters
Published
2001-06-12
Volume
87
Issue
1
Pages
017001-017001
ISSN
  • 0031-9007 (ISSN-L)
  • 1079-7114
OpenAlex
W1966788546
Cited by
271
References
12
FWCI
19.43
Type
journal article
Language
en
Open access
green

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Ando, Y., Lavrov, A. N., Komiya, S., Segawa, K., & Sun, X. F. (2001). Mobility of the Doped Holes and the Antiferromagnetic Correlations in Underdoped High-TcCuprates. Physical Review Letters. https://doi.org/10.1103/physrevlett.87.017001

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