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Cited by 163

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Far-Field Optical Microscopy with a Nanometer-Scale Resolution Based on the In-Plane Image Magnification by Surface Plasmon Polaritons

Open access
Smolyaninov, Igor I., Elliott, Jill, Zayats, Anatoly V., Davis, Christopher C.·2005·Physical Review Letters

Abstract

A new far-field optical microscopy capable of reaching nanometer-scale resolution is developed using the in-plane image magnification by surface plasmon polaritons. This approach is based on the optical properties of a metal-dielectric interface that may provide extremely large values of the effective refractive index neff up to 10(3) as seen by surface polaritons, and thus the diffraction limited resolution can reach nanometer-scale values of lambda/2neff. The experimental realization of the microscope has demonstrated the optical resolution better than 60 nm at 515 nm illumination wavelength.

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Crossref · 10.1103/physrevlett.94.057401

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Metadata

Authors
Smolyaninov, I. I., Elliott, J., Zayats, A. V., & Davis, C. C.
Venue
Physical Review Letters
Published
2005-02-07
Volume
94
Issue
5
Pages
057401-057401
ISSN
  • 0031-9007 (ISSN-L)
  • 1079-7114
OpenAlex
W4205743212
Cited by
163
References
1
FWCI
13.97
Type
journal article
Language
en
Open access
green

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CoChat. (2026). Citation check: Far-Field Optical Microscopy with a Nanometer-Scale Resolution Based on the In-Plane Image Magnification by Surface Plasmon Polaritons. https://app.cochat.ai/papers/10.1103/physrevlett.94.057401
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Smolyaninov, I. I., Elliott, J., Zayats, A. V., & Davis, C. C. (2005). Far-Field Optical Microscopy with a Nanometer-Scale Resolution Based on the In-Plane Image Magnification by Surface Plasmon Polaritons. Physical Review Letters. https://doi.org/10.1103/physrevlett.94.057401

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