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Cited by 346

The DOI matches its Crossref record; 21 of the 21 references it cites were found in a registry or an index.

Scaling of Resistance and Electron Mean Free Path of Single-Walled Carbon Nanotubes

Open access
Purewal, Meninder S., Hong, Byung Hee, Ravi, Anirudhh, Chandra, Bhupesh, Hone, James, Kim, Philip·2007·Physical Review Letters

Abstract

We present an experimental investigation on the scaling of resistance in individual single-walled carbon nanotube devices with channel lengths that vary 4 orders of magnitude on the same sample. The electron mean free path is obtained from the linear scaling of resistance with length at various temperatures. The low temperature mean free path is determined by impurity scattering, while at high temperature, the mean free path decreases with increasing temperature, indicating that it is limited by electron-phonon scattering. An unusually long mean free path at room temperature has been experimentally confirmed. Exponentially increasing resistance with length at extremely long length scales suggests anomalous localization effects.

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Crossref · 10.1103/physrevlett.98.186808

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Metadata

Authors
Purewal, M. S., Hong, B. H., Ravi, A., Chandra, B., Hone, J., & Kim, P.
Venue
Physical Review Letters
Published
2007-05-04
Volume
98
Issue
18
Pages
186808-186808
ISSN
  • 0031-9007 (ISSN-L)
  • 1079-7114
OpenAlex
W2147255616
Cited by
346
References
21
FWCI
14.63
Type
journal article
Language
en
Open access
green

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CoChat. (2026). Citation check: Scaling of Resistance and Electron Mean Free Path of Single-Walled Carbon Nanotubes. https://app.cochat.ai/papers/10.1103/physrevlett.98.186808
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Purewal, M. S., Hong, B. H., Ravi, A., Chandra, B., Hone, J., & Kim, P. (2007). Scaling of Resistance and Electron Mean Free Path of Single-Walled Carbon Nanotubes. Physical Review Letters. https://doi.org/10.1103/physrevlett.98.186808

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