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Cited by 625

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A rapid method for analysing the breadths of diffraction and spectral lines using the Voigt function

Langford, J. I.·1978·Journal of Applied Crystallography

Abstract

The Voigt function provides a rapid and easily applied method for interpreting the breadths of diffraction profiles in terms of specimen defects and for studying absorption or emission spectra. In the past, approximate methods have usually involved the assumption that the constituent profiles are either Cauchy (Lorentzian) or Gaussian, but a better representation of the experimental data is given by the convolution of these functions. The method is illustrated by analysis of the Cu Kαemission profile and of crystallite-size broadening in nickel powder.

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Metadata

Authors
Langford, J. I.
Venue
Journal of Applied Crystallography
Published
1978-02-01
Volume
11
Issue
1
Pages
10-14
ISSN
0021-8898 (ISSN-L)
OpenAlex
W2068625793
Cited by
625
References
1
FWCI
1.37
Type
journal article
Language
en
Open access
closed

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CoChat. (2026). Citation check: A rapid method for analysing the breadths of diffraction and spectral lines using the Voigt function. https://app.cochat.ai/papers/10.1107/s0021889878012601
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Langford, J. I. (1978). A rapid method for analysing the breadths of diffraction and spectral lines using the Voigt function. Journal of Applied Crystallography. https://doi.org/10.1107/s0021889878012601

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Contains information from the Semantic Scholar Academic Graph Datasets, made available under the ODC Attribution License (ODC-BY 1.0).

Semantic Scholar’s data is described in: Kinney, R., et al. (2023). The Semantic Scholar Open Data Platform. arXiv:2301.10140.