The DOI matches its Crossref record; 15 of the 15 references it cites were found in a registry or an index.
Whole powder pattern modelling
Abstract
A new approach for the modelling of diffraction patterns without using analytical profile functions is described and tested on ball milled f.c.c. Ni powder samples. The proposed whole powder pattern modelling (WPPM) procedure allows a one-step refinement of microstructure parameters by a direct modelling of the experimental pattern. Lattice parameter and defect content, expressed as dislocation density, outer cut-off radius, contrast factor, twin and deformation fault probabilities), can be refined together with the parameters (mean and variance) of a grain-size distribution. Different models for lattice distortions and domain size and shape can be tested to simulate or model diffraction data for systems as different as plastically deformed metals or finely dispersed crystalline powders. TEM pictures support the conclusions obtained by WPPM and confirm the validity of the proposed procedure.
Overview
The claims and statistics of this paper haven’t been checked yet.
Run the check — free, no account needed. It reads the open-access text and checks the sources it cites.
Integrity signals
Registry
Cites
Statistics
Verification
Claims the paper makes
The claims and statistics of this paper haven’t been checked yet.
Run the check — free, no account needed. It reads the open-access text and checks the sources it cites.
Self-check
Percentages, sums and reported differences re-computed from the paper’s own numbers.
The self-check needs the paper’s full text.
Citations
Cites
Physical Properties of Crystals
(2007) · Materials Today · doi:10.1016/s1369-7021(07)70138-4 · Cited by 7,769
Bulk nanostructured materials from severe plastic deformation
Valiev, R. Z., Islamgaliev, R. K., & Alexandrov, I. V. (2000) · Progress in Materials Science · doi:10.1016/s0079-6425(99)00007-9 · Cited by 6,478
X-ray diffraction procedures for polycrystalline and amorphous materials
Klug, H. P., & Alexander, L. (1954) · Cited by 6,000
Warren, Β. E. (1968) · Cited by 5,832
Young, R. A. (1993) · Crystal Research and Technology · Cited by 2,581
Unit-cell refinement from powder diffraction scans
Pawley, G. S. (1981) · Journal of Applied Crystallography · doi:10.1107/s0021889881009618 · Cited by 1,965
A fundamental parameters approach to X-ray line-profile fitting
Cheary, R. W., & Coelho, A. (1992) · Journal of Applied Crystallography · doi:10.1107/s0021889891010804 · Cited by 1,660
Granqvist, C. G., & Buhrman, R. A. (1976) · Journal of Applied Physics · doi:10.1063/1.322870 · Cited by 1,613
Ungár, T., Gubicza, J., Ribárik, G., & Borbély, A. (2001) · Journal of Applied Crystallography · doi:10.1107/s0021889801003715 · Cited by 789
Popa, N. C. (1998) · Journal of Applied Crystallography · doi:10.1107/s0021889897009795 · Cited by 640
Cited by
Karmaoui, M., Jorge, A. B., McMillan, P. F., Aliev, A. E., Pullar, R. C., Labrincha, J. A., & Tobaldi, D. M. (2018) · ACS Omega · doi:10.1021/acsomega.8b02122 · Cited by 222
Metadata
- Authors
- Scardi, P., & Leoni, M.
- Venue
- Acta Crystallographica Section A Foundations of Crystallography
- Published
- 2002-02-07
- Volume
- 58
- Issue
- 2
- Pages
- 190-200
- ISSN
- 0108-7673 (ISSN-L)
- OpenAlex
- W2070168290
- Cited by
- 538
- References
- 15
- FWCI
- 10.06
- Type
- journal article
- Language
- en
- Open access
- closed
About these checks
Registry, retraction, Cites and statistics results are computed, not judged, with one exception: a printed reference that no index lists is read once by a model before it counts as a citation error. Claims are extracted by a model and kept only when their quote appears verbatim in the text; each cited source is then checked, with a model’s help, for whether it says what the claim relies on. Those verdicts can be wrong — read the claim’s quote and the cited source before relying on one.
Statistics and arithmetic are recomputed, not judged.
Confidence bands are shown only for fields calibrated on our annotated test set. None is calibrated yet, so no band is shown.
What counts as a claim ›How we measure confidence ›How we check this ›
Are you an author, or do you see a problem with this page? Request a review
How to cite
Cite CoChat for the checks on this page, and the paper for its own findings.
- This page
- CoChat. (2026). Citation check: Whole powder pattern modelling. https://app.cochat.ai/papers/10.1107/s0108767301021298
- The paper
- Scardi, P., & Leoni, M. (2002). Whole powder pattern modelling. Acta Crystallographica Section A Foundations of Crystallography. https://doi.org/10.1107/s0108767301021298
Data sources
Bibliographic data: Semantic Scholar, OpenAlex, Crossref.
Contains information from the Semantic Scholar Academic Graph Datasets, made available under the ODC Attribution License (ODC-BY 1.0).
Semantic Scholar’s data is described in: Kinney, R., et al. (2023). The Semantic Scholar Open Data Platform. arXiv:2301.10140.
