Cited by 163Electron and X-Ray Spectroscopy TechniquesX-ray Spectroscopy and Fluorescence AnalysisAdvanced X-ray Imaging Techniques

The DOI matches its Crossref record; 33 of the 35 references it cites were found in a registry or an index.

Soft-X-ray ARPES facility at the ADRESS beamline of the SLS: concepts, technical realisation and scientific applications

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Strocov, V. N., Wang, X., Shi, M., Kobayashi, M., Krempasky, J., Hess, C., Schmitt, T., Patthey, L.·2014·Journal of Synchrotron Radiation

Abstract

Soft-X-ray angle-resolved photoelectron spectroscopy (ARPES) with photon energies around 1 keV combines the momentum space resolution with increasing probing depth. The concepts and technical realisation of the new soft-X-ray ARPES endstation at the ADRESS beamline of SLS are described. The experimental geometry of the endstation is characterized by grazing X-ray incidence on the sample to increase the photoyield and vertical orientation of the measurement plane. The vacuum chambers adopt a radial layout allowing most efficient sample transfer. High accuracy of the angular resolution is ensured by alignment strategies focused on precise matching of the X-ray beam and optical axis of the analyzer. The high photon flux of up to 10 13 photons s−1(0.01% bandwidth)−1 delivered by the beamline combined with the optimized experimental geometry break through the dramatic loss of the valence band photoexcitation cross section at soft-X-ray energies. ARPES images with energy resolution up to a few tens of meV are typically acquired on the time scale of minutes. A few application examples illustrate the power of our advanced soft-X-ray ARPES instrumentation to explore the electronic structure of bulk crystals with resolution in three-dimensional momentum, access buried heterostructures and study elemental composition of the valence states using resonant excitation.

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  1. Kobayashi, 2013, Available at http://arxiv., org/abs/13020063

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Metadata

Authors
Strocov, V. N., Wang, X., Shi, M., Kobayashi, M., Krempasky, J., Hess, C., Schmitt, T., & Patthey, L.
Affiliations
Paul Scherrer Institute (CH)
Venue
Journal of Synchrotron Radiation
Published
2013-11-07
Volume
21
Issue
1
Pages
32-44
ISSN
  • 0909-0495 (ISSN-L)
  • 1600-5775
OpenAlex
W2051471521
Cited by
163
References
35
Citations by year
2026: 4 · 2025: 9 · 2024: 15 · 2023: 15 · 2022: 18 · 2021: 15 · 2020: 13 · 2019: 18 · 2018: 13 · 2017: 16 · 2016: 12 · 2015: 13 · 2014: 2
FWCI
3.56
Type
journal article
Language
en
Open access
Locations
  • Journal of Synchrotron Radiation (publishedVersion)
  • PubMed (publishedVersion)
  • DORA PSI (Paul Scherrer Institute) (submittedVersion, other-oa)
Topics
  • Physical Sciences › Materials Science › Surfaces, Coatings and Films › Electron and X-Ray Spectroscopy Techniques
  • Physical Sciences › Physics and Astronomy › Radiation › X-ray Spectroscopy and Fluorescence Analysis
  • Physical Sciences › Physics and Astronomy › Radiation › Advanced X-ray Imaging Techniques
Keywords
soft X-ray ARPES, grazing incidence, beam alignment, angular resolution, buried heterostructure, resonant excitation

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