Cited by 18Microwave and Dielectric Measurement TechniquesElectromagnetic Simulation and Numerical MethodsElectromagnetic Compatibility and Measurements

The DOI matches its Crossref record; 10 of the 10 references it cites were found in a registry or an index.

Performance limits in TDR technique by Monte Carlo simulation

Letosa, J., Garcia-Gracia, M., Fornies-Marquina, J.M., Artacho, J.M.·1996·IEEE Transactions on Magnetics

Abstract

This paper researches the performance limits on the estimation of the electromagnetic properties of dielectrics with characteristic times of up to 10 ps using time domain techniques. Constructions of random values with correlation among those, supporting high-fidelity Monte Carlo simulations, are addressed. Precision of the magnitudes under test is obtained, this result is required to evaluate the optimal method. It is shown how a simulated noise restricted to the system bandwidth is sufficient to characterise the errors.

Overview

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Crossref · 10.1109/20.497401

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Metadata

Authors
Letosa, J., Garcia-Gracia, M., Fornies-Marquina, J. M., & Artacho, J. M.
Affiliations
Universidad de Zaragoza (ES)
Venue
IEEE Transactions on Magnetics
Published
1996-05
Volume
32
Issue
3
Pages
958-961
ISSN
0018-9464 (ISSN-L)
OpenAlex
W2101776063
Cited by
18
References
10
Citations by year
2019: 1 · 2016: 2 · 2015: 1 · 2014: 1 · 2013: 2
FWCI
1.45
Type
journal article
Language
en
Open access
closed
Locations
IEEE Transactions on Magnetics (publishedVersion)
Topics
  • Physical Sciences › Engineering › Electrical and Electronic Engineering › Microwave and Dielectric Measurement Techniques
  • Physical Sciences › Engineering › Electrical and Electronic Engineering › Electromagnetic Simulation and Numerical Methods
  • Physical Sciences › Engineering › Electrical and Electronic Engineering › Electromagnetic Compatibility and Measurements
Keywords
time domain reflectometry, performance bounds, correlated random variables, Monte Carlo simulation, measurement noise, system bandwidth

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