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Cited by 415

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Fast Keypoint Recognition in Ten Lines of Code

Open access
Ozuysal, Mustafa, Fua, Pascal, Lepetit, Vincent·2007·2007 IEEE Conference on Computer Vision and Pattern Recognition

Abstract

While feature point recognition is a key component of modern approaches to object detection, existing approaches require computationally expensive patch preprocessing to handle perspective distortion. In this paper, we show that formulating the problem in a Naive Bayesian classification framework makes such preprocessing unnecessary and produces an algorithm that is simple, efficient, and robust. Furthermore, it scales well to handle large number of classes. To recognize the patches surrounding keypoints, our classifier uses hundreds of simple binary features and models class posterior probabilities. We make the problem computationally tractable by assuming independence between arbitrary sets of features. Even though this is not strictly true, we demonstrate that our classifier nevertheless performs remarkably well on image datasets containing very significant perspective changes.

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Metadata

Authors
Ozuysal, M., Fua, P., & Lepetit, V.
Venue
2007 IEEE Conference on Computer Vision and Pattern Recognition
Publisher
IEEE
Published
2007-06
Pages
1-8
ISSN
1063-6919 (ISSN-L)
OpenAlex
W2101886560
Cited by
415
References
2
FWCI
30.11
Type
conference paper
Language
en
Open access
green

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CoChat. (2026). Citation check: Fast Keypoint Recognition in Ten Lines of Code. https://app.cochat.ai/papers/10.1109/cvpr.2007.383123
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Ozuysal, M., Fua, P., & Lepetit, V. (2007). Fast Keypoint Recognition in Ten Lines of Code. 2007 IEEE Conference on Computer Vision and Pattern Recognition. https://doi.org/10.1109/cvpr.2007.383123

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