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Cited by 2,280

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Visibility in bad weather from a single image

Tan, Robby T.·2008·2008 IEEE Conference on Computer Vision and Pattern Recognition

Abstract

Bad weather, such as fog and haze, can significantly degrade the visibility of a scene. Optically, this is due to the substantial presence of particles in the atmosphere that absorb and scatter light. In computer vision, the absorption and scattering processes are commonly modeled by a linear combination of the direct attenuation and the airlight. Based on this model, a few methods have been proposed, and most of them require multiple input images of a scene, which have either different degrees of polarization or different atmospheric conditions. This requirement is the main drawback of these methods, since in many situations, it is difficult to be fulfilled. To resolve the problem, we introduce an automated method that only requires a single input image. This method is based on two basic observations: first, images with enhanced visibility (or clear-day images) have more contrast than images plagued by bad weather; second, airlight whose variation mainly depends on the distance of objects to the viewer, tends to be smooth. Relying on these two observations, we develop a cost function in the framework of Markov random fields, which can be efficiently optimized by various techniques, such as graph-cuts or belief propagation. The method does not require the geometrical information of the input image, and is applicable for both color and gray images.

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Metadata

Authors
Tan, R. T.
Venue
2008 IEEE Conference on Computer Vision and Pattern Recognition
Publisher
IEEE
Published
2008-06
Pages
1-8
ISSN
1063-6919 (ISSN-L)
OpenAlex
W2114867966
Cited by
2,280
References
0
FWCI
28.32
Type
conference paper
Language
en
Open access
closed

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CoChat. (2026). Citation check: Visibility in bad weather from a single image. https://app.cochat.ai/papers/10.1109/cvpr.2008.4587643
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Tan, R. T. (2008). Visibility in bad weather from a single image. 2008 IEEE Conference on Computer Vision and Pattern Recognition. https://doi.org/10.1109/cvpr.2008.4587643

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