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Revisiting Local Descriptor Based Image-To-Class Measure for Few-Shot Learning

Open access
Li, Wenbin, Wang, Lei, Xu, Jinglin, Huo, Jing, Gao, Yang, Luo, Jiebo·2019·2019 IEEE/CVF Conference on Computer Vision and Pattern Recognition (CVPR)

Abstract

Few-shot learning in image classification aims to learn a classifier to classify images when only few training examples are available for each class. Recent work has achieved promising classification performance, where an image-level feature based measure is usually used. In this paper, we argue that a measure at such a level may not be effective enough in light of the scarcity of examples in few-shot learning. Instead, we think a local descriptor based image-to-class measure should be taken, inspired by its surprising success in the heydays of local invariant features. Specifically, building upon the recent episodic training mechanism, we propose a Deep Nearest Neighbor Neural Network (DN4 in short) and train it in an end-to-end manner. Its key difference from the literature is the replacement of the image-level feature based measure in the final layer by a local descriptor based image-to-class measure. This measure is conducted online via a k-nearest neighbor search over the deep local descriptors of convolutional feature maps. The proposed DN4 not only learns the optimal deep local descriptors for the image-to-class measure, but also utilizes the higher efficiency of such a measure in the case of example scarcity, thanks to the exchangeability of visual patterns across the images in the same class. Our work leads to a simple, effective, and computationally efficient framework for few-shot learning. Experimental study on benchmark datasets consistently shows its superiority over the related state-of-the-art, with the largest absolute improvement of 17% over the next best. The source code can be available from https://github.com/WenbinLee/DN4.git.

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Metadata

Authors
Li, W., Wang, L., Xu, J., Huo, J., Gao, Y., & Luo, J.
Venue
2019 IEEE/CVF Conference on Computer Vision and Pattern Recognition (CVPR)
Publisher
IEEE
Published
2019-06
Pages
7253-7260
ISSN
1063-6919 (ISSN-L)
OpenAlex
W2979689312
Cited by
654
References
2
FWCI
28.15
Type
conference paper
Language
en
Open access
green

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CoChat. (2026). Citation check: Revisiting Local Descriptor Based Image-To-Class Measure for Few-Shot Learning. https://app.cochat.ai/papers/10.1109/cvpr.2019.00743
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Li, W., Wang, L., Xu, J., Huo, J., Gao, Y., & Luo, J. (2019). Revisiting Local Descriptor Based Image-To-Class Measure for Few-Shot Learning. 2019 IEEE/CVF Conference on Computer Vision and Pattern Recognition (CVPR). https://doi.org/10.1109/cvpr.2019.00743

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