The DOI matches its Crossref record; 6 of the 6 references it cites were found in a registry or an index.
A true random number generator with on-line testability
Abstract
True random number generators (TRNGs) are widely used throughout cryptography. They are used in the challenge response authentication procedures, key generation and for hardening measures against power analysis attacks. An important feature of each TRNG is true randomness. Such randomness can be obtained from random physical effects like noise. In order to make a TRNG usable for different semiconductor technologies (including FPGAs) only digital standard library cells can be used. One possible type of TRNG that can be realized with only standard library cells is based on ring os-cillators. Such a TRNG was implemented in a test chip and investigated in combination with a simple post processing. Different on-line testability measures of the TRNG are proposed. The solution is compared with other ones.
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Cites
A Provably Secure True Random Number Generator with Built-In Tolerance to Active Attacks
Sunar, B., Martin, W. J., & Stinson, D. R. (2007) · IEEE Transactions on Computers · doi:10.1109/tc.2007.250627 · Cited by 673
True Random Number Generator Embedded in Reconfigurable Hardware
Fischer, V., & Drutarovský, M. (2003) · Lecture notes in computer science · doi:10.1007/3-540-36400-5_30 · Cited by 211
Analysis and Enhancement of Random Number Generator in FPGA Based on Oscillator Rings
Wold, K., & Tan, C. H. (2009) · International Journal of Reconfigurable Computing · doi:10.1155/2009/501672 · Cited by 168
Built-in test for complex digital integrated circuits
Konemann, B., Zwiehoff, G., & Mucha, J. (1980) · IEEE Journal of Solid-State Circuits · doi:10.1109/jssc.1980.1051391 · Cited by 158
Design of Testable Random Bit Generators
Bucci, M., & Luzzi, R. (2005) · Lecture notes in computer science · doi:10.1007/11545262_11 · Cited by 65
Bohl, E., & Ihle, M. (2012) · IEEE International On-Line Testing Symposium (IOLTS) · doi:10.1109/iolts.2012.6313851 · Cited by 12
Self-citation
Research works printed but not linked: 5
- boehl, 0, A collision resistant drbg with fault attackdetection possibilities, ETS, 2014
- galkin, 2013, Untersuchung und Bewertung der Eigenschaften Eines TRNGs Anhand von zu Erfassenden Messdaten Eines Testchips und der Nachzubildenden Aufbereitung
- fischer, 2009, True Random Number Generators in Configurable Logic Devices, 1
- schindler, 2001, Functionality classes and evaluation methodology for true (physical) random number generators, AIS31
- markettos, 2009, The frequency injection attackon ring-oscillator-based true random number generators, Workshop on CryptographicHar Dware and Embedded Systems (CHES
Cited by
Sorted by citations
True Random Number Generators Using Electrical Noise
Gong, L., Zhang, J., Liu, H., Sang, L., & Wang, Y. (2019) · IEEE Access · doi:10.1109/access.2019.2939027 · Cited by 77
“presented the on-line testable solution to ensure randomness [63].”
BackgroundLightweight TRNG Based on Multiphase Timing of Bistables
Wieczorek, P. Z. (2016) · IEEE Transactions on Circuits and Systems I: Regular Papers · doi:10.1109/tcsi.2016.2555248 · Cited by 27
Metadata
- Authors
- Bohl, E., Lewis, M., & Galkin, S.
- Affiliations
- Robert Bosch (Germany) (DE)
- Pforzheim University of Applied Sciences (DE)
- Venue
- 2014 19th IEEE European Test Symposium (ETS)
- Publisher
- IEEE
- Published
- 2014-05
- Pages
- 1-6
- ISSN
- 1530-1877 (ISSN-L)
- OpenAlex
- W2098280680
- Cited by
- 9
- References
- 6
- Citations by year
- 2025: 1 · 2019: 3 · 2017: 1 · 2016: 1 · 2015: 2 · 2014: 1
- FWCI
- 1.09
- Type
- conference paper
- Language
- en
- Open access
- closed
- Locations
- IEEE European Test Symposium (ETS) (publishedVersion)
- Topics
- Physical Sciences › Computer Science › Hardware and Architecture › Physical Unclonable Functions (PUFs) and Hardware Security
- Physical Sciences › Computer Science › Artificial Intelligence › Cryptographic Implementations and Security
- Physical Sciences › Computer Science › Hardware and Architecture › VLSI and Analog Circuit Testing
- Keywords
- true random number generator, ring oscillator, FPGA, post-processing, randomness, test chip, power analysis attacks
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- The paper
- Bohl, E., Lewis, M., & Galkin, S. (2014). A true random number generator with on-line testability. 2014 19th IEEE European Test Symposium (ETS). https://doi.org/10.1109/ets.2014.6847799
