A Novel Intelligent Power Module in Embedded Packaging with Low Parasitic Inductance and Low Thermal Resistance
Abstract
By combining embedding and 3D stacking techniques, a novel intelligent power module is introduced in this paper. The power stages are embedded and stacked in the organic substrates and the drivers are surface mounted on the board. The connection of gate drivers and power devices is conducted via copper wiring, leading to a shorter path and a smaller parasitic inductance. Specifically, the parasitic inductance of GS loop is decreased from 45 nH to 20 nH, reaching an almost 56% reduction. The SiC MOSFETs are stacked vertically to achieve half-bridge circuit and the inductance of DS loop is reduced from 5.4nH to 2.3 nH. Moreover, the power density is improved from 11.4 A/cm2to 18.2 A/cm2. It is worth to mention that the heat sinks are directly bonded to the module by insulation material with high thermal conductivity, thus optimizing the heat dissipation path and improving the Rjf performance significantly.
Integrity signals
Registry
Cites
Statistics
Claims the paper makes
Claims other papers make about this one
Each is checked against this paper’s own text: does it say what the citing paper says it does?
Embedded packaging places power dies inside the printed circuit board, which lowers parasitic inductance and capacitance, reduces package height, and creates an efficient vertical thermal path.
“Embedded packaging places power dies inside the printed circuit board (PCB), which lowers parasitic inductance/capacitance, reduces package height, and creates an efficient vertical thermal path.”
From Thermal Management of Wide-Bandgap Power Semiconductors: Strategies and Challenges in SiC and GaN Power Devices (2025) · cites this paper as [47]
Embedded packaging provides inherent electromagnetic interference shielding and significantly improves robustness against thermal cycling and electrical overstress.
“The embedded paradigm also provides inherent electromagnetic interference (EMI) shielding and significantly improves robustness against thermal cycling and electrical overstress [29,45-49].”
From Thermal Management of Wide-Bandgap Power Semiconductors: Strategies and Challenges in SiC and GaN Power Devices (2025) · cites this paper as [47]
Cites
Comparisons of SiC MOSFET and Si IGBT Based Motor Drive Systems
Zhao, T., Wang, J., Huang, A. Q., & Agarwal, A. (2007) · IEEE Industry Applications Society Annual Meeting (IAS) · doi:10.1109/07ias.2007.51 · Cited by 169 · see citing works
Self-citationOptimized Power Modules for Silicon Carbide mosfet
Regnat, G., Jeannin, P., Frey, D., et al. (2017) · IEEE Transactions on Industry Applications · doi:10.1109/tia.2017.2784802 · Cited by 51 · see citing works
Comparison of the power losses in 1700V Si IGBT and SiC MOSFET modules including reverse conduction
Rąbkowski, J., & Płatek, T. (2015) · European Conference on Power Electronics and Applications · doi:10.1109/epe.2015.7309444 · Cited by 38 · see citing works
Application of the Spark Plasma Sintering Technique to Low-Temperature Copper Bonding
Mouawad, B., Soueidan, M., Fabrègue, D., Buttay, C., Allard, B., Bley, V., Morel, H., & Martín, C. (2012) · IEEE Transactions on Components Packaging and Manufacturing Technology · doi:10.1109/tcpmt.2012.2186453 · Cited by 18 · see citing works
Wang, Y., Rong, X., Yang, C., et al. (2023) · Microelectronics Reliability · doi:10.1016/j.microrel.2023.115200 · Cited by 13 · see citing works
Thermal characterization of a 500W motor driver module with embedded power transistors
Nicolics, J., Unger, M., Gros, S., et al. (2017) · International Spring Seminar on Electronics Technology · doi:10.1109/isse.2017.8000901 · Cited by 2 · see citing works
A novel heat dissipation structure for PSiP package
Hou, Z., Liao, X., Peng, H., et al. (2022) · International Conference on Electronic Packaging Technology (ICEPT) · doi:10.1109/icept56209.2022.9873198 · Cited by 1 · see citing works
Self-citation
Flagged first, then by citations
Cited by
Sorted by citations
Han, G., Kim, J., Park, S., & Bae, W. (2025) · Electronics · doi:10.3390/electronics14214193 · Cited by 34 · see citing works
- Authors
- Wang, J., Liu, Z., Peng, H., & Ren, X.
- Affiliations
- Shanghai Huawei Digital Power Technologies Co., Ltd.,Shanghai,China
- Venue
- 2024 25th International Conference on Electronic Packaging Technology (ICEPT)
- Publisher
- IEEE
- Published
- 2024-08-07
- Pages
- 1-4
- OpenAlex
- W4402743222
- Cited by
- 4
- References
- 7
- Citations by year
- 2026: 1 · 2025: 3
- FWCI
- 3.06
- Type
- conference paper
- Language
- en
- Open access
- closed
- Locations
- International Conference on Electronic Packaging Technology (ICEPT) (publishedVersion)
- Topics
- Physical Sciences › Engineering › Electrical and Electronic Engineering › Silicon Carbide Semiconductor Technologies
- Physical Sciences › Engineering › Electrical and Electronic Engineering › Advanced DC-DC Converters
- Physical Sciences › Engineering › Electrical and Electronic Engineering › 3D IC and TSV technologies
- Keywords
- intelligent power module, 3D stacking, parasitic inductance reduction, thermal resistance, SiC MOSFET, half-bridge circuit, organic substrates, gate driver, power density
About these checks
Registry, retraction, Cites and statistics results are computed, not judged, with one exception: a printed reference that no index lists is read once by a model before it counts as a citation error. Claims are extracted by a model and kept only when their quote appears verbatim in the text; each cited source is then checked, with a model’s help, for whether it says what the claim relies on. Those verdicts can be wrong — read the claim’s quote and the cited source before relying on one.
Statistics and arithmetic are recomputed, not judged.
Confidence bands are shown only for fields calibrated on our annotated test set. None is calibrated yet, so no band is shown.
What counts as a claim ›How we measure confidence ›How we check this ›
Are you an author, or do you see a problem with this page? Request a review