The DOI matches its Crossref record; 37 of the 37 references it cites were found in a registry or an index.
Counterfeit Integrated Circuits: A Rising Threat in the Global Semiconductor Supply Chain
Abstract
As the electronic component supply chain grows more complex due to globalization, with parts coming from a diverse set of suppliers, counterfeit electronics have become a major challenge that calls for immediate solutions. Currently, there are a few standards and programs available that address the testing for such counterfeit parts. However, not enough research has yet addressed the detection and avoidance of all counterfeit parts-recycled, remarked, overproduced, cloned, out-of-spec/defective, and forged documentation-currently infiltrating the electronic component supply chain. Even if they work initially, all these parts may have reduced lifetime and pose reliability risks. In this tutorial, we will provide a review of some of the existing counterfeit detection and avoidance methods. We will also discuss the challenges ahead for implementing these methods, as well as the development of new detection and avoidance mechanisms.
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Scanning Electron Microscopy and X-Ray Microanalysis
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Physical unclonable functions for device authentication and secret key generation
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Scanning Electron Microscopy and X-ray Microanalysis: Third Edition
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Silicon physical random functions
Gassend, B., Clarke, D., van Dijk, M., & Devadas, S. (2002) · Proceedings of the 9th ACM conference on Computer and communications security · doi:10.1145/586110.586132 · Cited by 1,660
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A Survey of Hardware Trojan Taxonomy and Detection
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Self-citationOn the (Im)possibility of Obfuscating Programs
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Blockchain in IoT: Current Trends, Challenges, and Future Roadmap
Cui, P., Guin, U., Skjellum, A., & Umphress, D. (2019) · Journal of Hardware and Systems Security · doi:10.1007/s41635-019-00079-5 · Cited by 73
Self-citationAlam, M., Tehranipoor, M. M., & Guin, U. (2017) · Journal of Hardware and Systems Security · doi:10.1007/s41635-017-0028-8 · Cited by 26
Self-citationGenetic physical unclonable functions in human cells
Li, Y., Bidmeshki, M. M., Kang, T., Nowak, C. M., Makris, Y., & Bleris, L. (2022) · Science Advances · doi:10.1126/sciadv.abm4106 · Cited by 12
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Metadata
- Authors
- Guin, U., Huang, K., DiMase, D., Carulli, J. M., Tehranipoor, M., & Makris, Y.
- Venue
- Proceedings of the IEEE
- Published
- 2014-08
- Volume
- 102
- Issue
- 8
- Pages
- 1207-1228
- ISSN
- 0018-9219 (ISSN-L)
- 1558-2256
- OpenAlex
- W2099101940
- Cited by
- 561
- References
- 37
- FWCI
- 46.73
- Type
- journal article
- Language
- en
- Open access
- closed
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- Guin, U., Huang, K., DiMase, D., Carulli, J. M., Tehranipoor, M., & Makris, Y. (2014). Counterfeit Integrated Circuits: A Rising Threat in the Global Semiconductor Supply Chain. Proceedings of the IEEE. https://doi.org/10.1109/jproc.2014.2332291
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Contains information from the Semantic Scholar Academic Graph Datasets, made available under the ODC Attribution License (ODC-BY 1.0).
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