Cited by 60Photonic and Optical DevicesSemiconductor Lasers and Optical DevicesAdvanced MEMS and NEMS Technologies

Multi-Micron Silicon Photonics Platform for Highly Manufacturable and Versatile Photonic Integrated Circuits

Zilkie, Aaron J., Srinivasan, Pradeep, Trita, Andrea, Schrans, Thomas, Yu, Guomin, Byrd, Jerry, Nelson, David A., Muth, Karl +15 more·2019·IEEE Journal of Selected Topics in Quantum Electronics

Abstract

We describe and characterize a multi-micron silicon photonics platform that was designed to combine performance, power efficiency, manufacturability, and versatility for integrated photonic applications ranging from data communications to sensors. We outline the attributes needed for broad applicability, high-volume manufacturing, and large-scale deployment of silicon photonics, and describe how the platform is favorable with respect to these attributes. We present demonstrations of key technologies needed for the communications and sensing applications, including low-loss fiber attach, compact low-loss filters, efficient hybrid wavelength division multiplexed lasers, and high-speed electro-absorption modulators and integrated photodetectors.

Integrity signals

Registry

Crossref · 10.1109/jstqe.2019.2911432

Cites

3 of 3 references verified0 citation errors · 0 not checkable

Statistics

Recomputing p-values needs the paper’s full text.

Claims the paper makes

We couldn’t retrieve this paper’s full text, so its claims and self-check weren’t run. The registry and citation checks still apply.

Claims other papers make about this one

Each is checked against this paper’s own text: does it say what the citing paper says it does?

  • This becomes the most significant bottleneck, since new waveguides (vs. the standard 220 nm) and other photonic components have to be designed, tested, and characterized.

    “This becomes the most significant bottleneck, since new waveguides (vs. the standard 220 nm) and other photonic components have to be designed, tested, and characterized155.”

    From Roadmapping the next generation of silicon photonics (2024) · cites this paper as [155]

Cites

Flagged first, then by citations

Cited by

Sorted by citations

Authors
Zilkie, A. J., Srinivasan, P., Trita, A., Schrans, T., Yu, G., Byrd, J., Nelson, D. A., Muth, K., Lerose, D., Alalusi, M., Masuda, K., Ziebell, M., Abediasl, H., Drake, J., Miller, G., Nykanen, H., Kho, E., Liu, Y., Liang, H., Yang, H., Peters, F. H., Nagra, A. S., & Rickman, A. G.
Affiliations
  • Rockley Photonics (United States) (US)
  • Tyndall National Institute (IE)
Venue
IEEE Journal of Selected Topics in Quantum Electronics
Published
2019-09
Volume
25
Issue
5
Pages
1-13
ISSN
  • 1077-260X (ISSN-L)
  • 1558-4542
OpenAlex
W2941213722
Cited by
60
References
3
Citations by year
2026: 4 · 2025: 6 · 2024: 7 · 2023: 10 · 2022: 15 · 2021: 7 · 2020: 8 · 2019: 3
FWCI
2.97
Type
journal article
Language
en
Open access
closed
Locations
  • IEEE Journal of Selected Topics in Quantum Electronics (publishedVersion)
  • Arrow@dit (Dublin Institute of Technology) (submittedVersion)
  • Cork Open Research Archive (University College Cork, Ireland) (submittedVersion)
Funders
  • Business Finland and Tekes (5910/31/2017)
  • RAPSI (55388)
  • OPEC (2814/31/2015)
Topics
  • Physical Sciences › Engineering › Electrical and Electronic Engineering › Photonic and Optical Devices
  • Physical Sciences › Engineering › Electrical and Electronic Engineering › Semiconductor Lasers and Optical Devices
  • Physical Sciences › Engineering › Electrical and Electronic Engineering › Advanced MEMS and NEMS Technologies
Keywords
photonic integrated circuits, manufacturability, high-volume manufacturing, data transmission, optical sensors, electroabsorption modulator, integrated photodetector, power efficiency

About these checks

Registry, retraction, Cites and statistics results are computed, not judged, with one exception: a printed reference that no index lists is read once by a model before it counts as a citation error. Claims are extracted by a model and kept only when their quote appears verbatim in the text; each cited source is then checked, with a model’s help, for whether it says what the claim relies on. Those verdicts can be wrong — read the claim’s quote and the cited source before relying on one.

Statistics and arithmetic are recomputed, not judged.

Confidence bands are shown only for fields calibrated on our annotated test set. None is calibrated yet, so no band is shown.

What counts as a claim ›How we measure confidence ›How we check this ›

Are you an author, or do you see a problem with this page? Request a review