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The DOI matches its Crossref record; 5 of the 5 references it cites were found in a registry or an index.

Tunneling Field-Effect Transistors (TFETs) With Subthreshold Swing (SS) Less Than 60 mV/dec

Woo Young Choi, Byung-Gook Park, Jong Duk Lee, Tsu-Jae King Liu·2007·IEEE Electron Device Letters

Abstract

We have demonstrated a 70-nm n-channel tunneling field-effect transistor (TFET) which has a subthreshold swing (SS) of 52.8 mV/dec at room temperature. It is the first experimental result that shows a sub-60-mV/dec SS in the silicon-based TFETs. Based on simulation results, the gate oxide and silicon-on-insulator layer thicknesses were scaled down to 2 and 70 nm, respectively. However, theon/offcurrent ratio of the TFET was still lower than that of the MOSFET. In order to increase theoncurrent further, the following approaches can be considered: reduction of effective gate oxide thickness, increase in the steepness of the gradient of the source to channel doping profile, and utilization of a lower bandgap channel material.

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Metadata

Authors
Choi, W. Y., Park, B.-G., Lee, J. D., & Liu, T.-J. K.
Venue
IEEE Electron Device Letters
Published
2007-08
Volume
28
Issue
8
Pages
743-745
ISSN
0741-3106 (ISSN-L)
OpenAlex
W2110584581
Cited by
1,923
References
5
FWCI
38.12
Type
journal article
Language
en
Open access
closed

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Choi, W. Y., Park, B.-G., Lee, J. D., & Liu, T.-J. K. (2007). Tunneling Field-Effect Transistors (TFETs) With Subthreshold Swing (SS) Less Than 60 mV/dec. IEEE Electron Device Letters. https://doi.org/10.1109/led.2007.901273

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