Student or educator? Sign up with your school email and get 6 months of Pro free.
CoChat
Sign Up
Cited by 801

The DOI matches its Crossref record.

CMOS image sensors

El Gamal, A., Eltoukhy, H.·2005·IEEE Circuits and Devices Magazine
DOI 10.1109/mcd.2005.1438751
Open this paper in CoChat — free account

Abstract

In this article, we provide a basic introduction to CMOS image-sensor technology, design and performance limits and present recent developments and future directions in this area. We also discuss image-sensor operation and describe the most popular CMOS image-sensor architectures. We note the main non-idealities that limit CMOS image sensor performance, and specify several key performance measures. One of the most important advantages of CMOS image sensors over CCDs is the ability to integrate sensing with analog and digital processing down to the pixel level. Finally, we focus on recent developments and future research directions that are enabled by pixel-level processing, the applications of which promise to further improve CMOS image sensor performance and broaden their applicability beyond current markets.

Overview

The claims and statistics of this paper haven’t been checked yet.

Run the check — free, no account needed. It reads the open-access text and checks the sources it cites.

A few free checks a day · papers already verified open instantly · results are public

Integrity signals

Registry

Crossref · 10.1109/mcd.2005.1438751

Cites

Statistics

Verification

Claims the paper makes

The claims and statistics of this paper haven’t been checked yet.

Run the check — free, no account needed. It reads the open-access text and checks the sources it cites.

A few free checks a day · papers already verified open instantly · results are public

Self-check

Percentages, sums and reported differences re-computed from the paper’s own numbers.

The self-check needs the paper’s full text.

Citations

Cited by

See all 801

Metadata

Authors
El Gamal, A., & Eltoukhy, H.
Venue
IEEE Circuits and Devices Magazine
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Published
2005-05
Volume
21
Issue
3
Pages
6-20
ISSN
  • 1558-1888 (ISSN-L)
  • 8755-3996
DOI
10.1109/mcd.2005.1438751
OpenAlex
W2744769585
Cited by
801
References
0
FWCI
24.15
Type
journal article
Language
en
Open access
closed

About these checks

Registry, retraction, Cites and statistics results are computed, not judged, with one exception: a printed reference that no index lists is read once by a model before it counts as a citation error. Claims are extracted by a model and kept only when their quote appears verbatim in the text; each cited source is then checked, with a model’s help, for whether it says what the claim relies on. Those verdicts can be wrong — read the claim’s quote and the cited source before relying on one.

Statistics and arithmetic are recomputed, not judged.

Confidence bands are shown only for fields calibrated on our annotated test set. None is calibrated yet, so no band is shown.

What counts as a claim ›How we measure confidence ›How we check this ›

Are you an author, or do you see a problem with this page? Request a review

How to cite

Cite CoChat for the checks on this page, and the paper for its own findings.

This page
CoChat. (2026). Citation check: CMOS image sensors. https://app.cochat.ai/papers/10.1109/mcd.2005.1438751
The paper
El Gamal, A., & Eltoukhy, H. (2005). CMOS image sensors. IEEE Circuits and Devices Magazine. https://doi.org/10.1109/mcd.2005.1438751

Data sources

Bibliographic data: Semantic Scholar, OpenAlex, Crossref.

Contains information from the Semantic Scholar Academic Graph Datasets, made available under the ODC Attribution License (ODC-BY 1.0).

Semantic Scholar’s data is described in: Kinney, R., et al. (2023). The Semantic Scholar Open Data Platform. arXiv:2301.10140.