The DOI matches its Crossref record; 9 of the 9 references it cites were found in a registry or an index.
Advanced Microwave Imaging
Abstract
Due to the enormous advances made in semiconductor technology over the last few years, high integration densities with moderate costs are achievable even in the millimeter-wave (mm-wave) range and beyond, which encourage the development of imaging systems with a high number of channels. The mm-wave range lies between 30 and 300 GHz, with corresponding wavelengths between 10 and 1 mm. While imaging objects with signals of a few millimeters in wavelength, many optically opaque objects appear transparent, making mm-wave imaging attractive for a wide variety of commercial and scientific applications like nondestructive testing (NDT), material characterization, security scanning, and medical screening. The spatial resolution in lateral and range directions as well as the image dynamic range offered by an imaging system are considered the main measures of performance. With the availability of more channels combined with the powerful digital signal processing (DSP) capabilities of modern computers, the performance of mm-wave imaging systems is advancing rapidly.
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Cites
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A Novel Fully Electronic Active Real-Time Imager Based on a Planar Multistatic Sparse Array
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Self-citationThe very large array: Design and performance of a modern synthesis radio telescope
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Cited by
Terahertz Quality Inspection for Automotive and Aviation Industries
Ellrich, F., Bauer, M., Schreiner, N., Keil, A., Pfeiffer, T., Klier, J., Weber, S., Jonuscheit, J., Friederich, F., & Molter, D. (2020) · Journal of Infrared, Millimeter, and Terahertz Waves · doi:10.1007/s10762-019-00639-4 · Cited by 184
Metadata
- Authors
- Ahmed, S. S., Schiessl, A., Gumbmann, F., Tiebout, M., Methfessel, S., & Schmidt, L.-P.
- Venue
- IEEE Microwave Magazine
- Published
- 2012-09
- Volume
- 13
- Issue
- 6
- Pages
- 26-43
- ISSN
- 1527-3342 (ISSN-L)
- 1557-9581
- OpenAlex
- W2074873696
- Cited by
- 326
- References
- 9
- FWCI
- 6.28
- Type
- journal article
- Language
- en
- Open access
- closed
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- Ahmed, S. S., Schiessl, A., Gumbmann, F., Tiebout, M., Methfessel, S., & Schmidt, L.-P. (2012). Advanced Microwave Imaging. IEEE Microwave Magazine. https://doi.org/10.1109/mmm.2012.2205772
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Contains information from the Semantic Scholar Academic Graph Datasets, made available under the ODC Attribution License (ODC-BY 1.0).
Semantic Scholar’s data is described in: Kinney, R., et al. (2023). The Semantic Scholar Open Data Platform. arXiv:2301.10140.
