The DOI matches its Crossref record; 11 of the 11 references it cites were found in a registry or an index.
DeepJIT: An End-to-End Deep Learning Framework for Just-in-Time Defect Prediction
Abstract
Software quality assurance efforts often focus on identifying defective code. To find likely defective code early, change-level defect prediction - aka. Just-In-Time (JIT) defect prediction - has been proposed. JIT defect prediction models identify likely defective changes and they are trained using machine learning techniques with the assumption that historical changes are similar to future ones. Most existing JIT defect prediction approaches make use of manually engineered features. Unlike those approaches, in this paper, we propose an end-to-end deep learning framework, named DeepJIT, that automatically extracts features from commit messages and code changes and use them to identify defects. Experiments on two popular software projects (i.e., QT and OPENSTACK) on three evaluation settings (i.e., cross-validation, short-period, and long-period) show that the best variant of DeepJIT (DeepJIT-Combined), compared with the best performing state-of-the-art approach, achieves improvements of 10.36-11.02% for the project QT and 9.51-13.69% for the project OPENSTACK in terms of the Area Under the Curve (AUC).
Overview
The claims and statistics of this paper haven’t been checked yet.
Run the check — free, no account needed. It reads the open-access text and checks the sources it cites.
Integrity signals
Registry
Cites
Statistics
Verification
Claims the paper makes
The claims and statistics of this paper haven’t been checked yet.
Run the check — free, no account needed. It reads the open-access text and checks the sources it cites.
Self-check
Percentages, sums and reported differences re-computed from the paper’s own numbers.
The self-check needs the paper’s full text.
Citations
Cites
Deep Residual Learning for Image Recognition
He, K., Zhang, X., Ren, S., & Sun, J. (2016) · 2016 IEEE Conference on Computer Vision and Pattern Recognition (CVPR) · doi:10.1109/cvpr.2016.90 · Cited by 235,474
ImageNet classification with deep convolutional neural networks
Krizhevsky, A., Sutskever, I., & Hinton, G. E. (2017) · Communications of the ACM · doi:10.1145/3065386 · Cited by 112,155
Adam: A Method for Stochastic Optimization
Kingma, D. P., & Ba, J. (2014) · arXiv · doi:10.48550/arxiv.1412.6980 · Cited by 98,946
LeCun, Y., Bengio, Y., & Hinton, G. (2015) · Nature · doi:10.1038/nature14539 · Cited by 84,126
A Study of Cross-Validation and Bootstrap for Accuracy Estimation and Model Selection
Kohavi, R. (1995) · Zenodo · doi:10.5281/zenodo.19712698 · Cited by 10,909
Improving neural networks by preventing co-adaptation of feature detectors
Hinton, G. E., Srivastava, N., Krizhevsky, A., Sutskever, I., & Salakhutdinov, R. R. (2012) · arXiv · doi:10.48550/arxiv.1207.0580 · Cited by 6,382
Large-Scale Video Classification with Convolutional Neural Networks
Karpathy, A., Toderici, G., Shetty, S., Leung, T., Sukthankar, R., & Fei-Fei, L. (2014) · 2014 IEEE Conference on Computer Vision and Pattern Recognition · doi:10.1109/cvpr.2014.223 · Cited by 6,354 · cited 1×
“) and demonstrated to achieve promising results [22]–[24].”
Particular object retrieval with integral max-pooling of CNN activations
Tolias, G., Sicre, R., & Jégou, H. (2015) · arXiv · doi:10.48550/arxiv.1511.05879 · Cited by 744
Deep learning for classification of colorectal polyps on whole-slide images
Korbar, B., Olofson, A. M., Miraflor, A. P., Nicka, C. M., Suriawinata, M. A., Torresani, L., Suriawinata, A. A., & Hassanpour, S. (2017) · Journal of Pathology Informatics · doi:10.4103/jpi.jpi_34_17 · Cited by 349
Tu, Z., Su, Z., & Devanbu, P. (2014) · Proceedings of the 22nd ACM SIGSOFT International Symposium on Foundations of Software Engineering · doi:10.1145/2635868.2635875 · Cited by 238
Cited by
A Systematic Literature Review on the Use of Deep Learning in Software Engineering Research
Watson, C., Cooper, N., Palacio, D. N., Moran, K., & Poshyvanyk, D. (2022) · ACM Transactions on Software Engineering and Methodology · doi:10.1145/3485275 · Cited by 137
CCT5: A Code-Change-Oriented Pre-trained Model
Lin, B., Wang, S., Liu, Z., Liu, Y., Xia, X., & Mao, X. (2023) · Proceedings of the 31st ACM Joint European Software Engineering Conference and Symposium on the Foundations of Software Engineering · doi:10.1145/3611643.3616339 · Cited by 69
(2023) · doi:10.1109/ase56229.2023.00157 · Cited by 14
Self-citation
Metadata
- Authors
- Hoang, T., Khanh Dam, H., Kamei, Y., Lo, D., & Ubayashi, N.
- Venue
- 2019 IEEE/ACM 16th International Conference on Mining Software Repositories (MSR)
- Publisher
- IEEE
- Published
- 2019-05
- Pages
- 34-45
- OpenAlex
- W2955991060
- Cited by
- 223
- References
- 11
- FWCI
- 17.82
- Type
- conference paper
- Language
- en
- Open access
- closed
About these checks
Registry, retraction, Cites and statistics results are computed, not judged, with one exception: a printed reference that no index lists is read once by a model before it counts as a citation error. Claims are extracted by a model and kept only when their quote appears verbatim in the text; each cited source is then checked, with a model’s help, for whether it says what the claim relies on. Those verdicts can be wrong — read the claim’s quote and the cited source before relying on one.
Statistics and arithmetic are recomputed, not judged.
Confidence bands are shown only for fields calibrated on our annotated test set. None is calibrated yet, so no band is shown.
What counts as a claim ›How we measure confidence ›How we check this ›
Are you an author, or do you see a problem with this page? Request a review
How to cite
Cite CoChat for the checks on this page, and the paper for its own findings.
- This page
- CoChat. (2026). Citation check: DeepJIT: An End-to-End Deep Learning Framework for Just-in-Time Defect Prediction. https://app.cochat.ai/papers/10.1109/msr.2019.00016
- The paper
- Hoang, T., Khanh Dam, H., Kamei, Y., Lo, D., & Ubayashi, N. (2019). DeepJIT: An End-to-End Deep Learning Framework for Just-in-Time Defect Prediction. 2019 IEEE/ACM 16th International Conference on Mining Software Repositories (MSR). https://doi.org/10.1109/msr.2019.00016
Data sources
Bibliographic data: Semantic Scholar, OpenAlex, Crossref.
Contains information from the Semantic Scholar Academic Graph Datasets, made available under the ODC Attribution License (ODC-BY 1.0).
Semantic Scholar’s data is described in: Kinney, R., et al. (2023). The Semantic Scholar Open Data Platform. arXiv:2301.10140.