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Commonly observed degradation in field-aged photovoltaic modules

Quintana, M.A., King, D.L., McMahon, T.J., Osterwald, C.R.·2003·Conference Record of the Twenty-Ninth IEEE Photovoltaic Specialists Conference, 2002.

Abstract

Degradation leading to failure in photovoltaic modules follows a progression that is dependent on multiple factors, some of which interact causing degradation that is difficult to simulate in the lab. This paper defines observed degradation in field-aged modules, including degradation of packaging materials, adhesional loss, degradation of interconnects, degradation due to moisture intrusion, and semiconductor device degradation. Additionally, this paper suggests that the onset and progression of degradation need to be studied to gain a more comprehensive understanding of module degradation rates and module failures.

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Metadata

Authors
Quintana, M. A., King, D. L., McMahon, T. J., & Osterwald, C. R.
Venue
Conference Record of the Twenty-Ninth IEEE Photovoltaic Specialists Conference, 2002.
Publisher
IEEE
Published
2003-10-31
Pages
1436-1439
ISSN
0160-8371 (ISSN-L)
OpenAlex
W2150099345
Cited by
291
References
0
FWCI
7.80
Type
conference paper
Language
en
Open access
closed

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CoChat. (2026). Citation check: Commonly observed degradation in field-aged photovoltaic modules. https://app.cochat.ai/papers/10.1109/pvsc.2002.1190879
The paper
Quintana, M. A., King, D. L., McMahon, T. J., & Osterwald, C. R. (2003). Commonly observed degradation in field-aged photovoltaic modules. Conference Record of the Twenty-Ninth IEEE Photovoltaic Specialists Conference, 2002. https://doi.org/10.1109/pvsc.2002.1190879

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Contains information from the Semantic Scholar Academic Graph Datasets, made available under the ODC Attribution License (ODC-BY 1.0).

Semantic Scholar’s data is described in: Kinney, R., et al. (2023). The Semantic Scholar Open Data Platform. arXiv:2301.10140.