On the Switching Parameter Variation of Metal-Oxide RRAM—Part I: Physical Modeling and Simulation Methodology
Guan, Ximeng, Yu, Shimeng, Wong, H.-S. Philip·2012·IEEE Transactions on Electron Devices
Cited by (355)
Items 301–355 of 355
- Monte Carlo simulation of multilevel switching in hybrid CMOS/memristive nanoelectronic circuitsArne Heittmann, Tobias G. Noll · 2012 · International Semiconductor Conference Dresden-Grenoble (ISCDG)
- Compact models of emerging devicesChi-Shuen Lee, Shimeng Yu, Ximeng Guan, Jieying Luo, Lan Wei, H.‐S. Philip Wong · 2013 · IEEE International Conference on Electron Devices and Solid-State Circuits (EDSSC)
- Variability evaluation of feedback circuits used in nanoelectronic Memristive/CMOS circuitsArne Heittmann, Tobias G. Noll · 2013 · ACM Great Lakes Symposium on VLSI (GLSVLSI)
- Guideline model for the bias-scheme-dependent power consumption of a resistive random access memory crossbar arrayWookyung Sun, Sujin Choi, Hyein Lim, Hyungsoon Shin · 2016 · Japanese Journal of Applied Physics
- Modeling of memristor device & analysis of stability issuesAyesha Zaman, Weisong Wang, Guru Subramanyam · 2017 · IEEE National Aerospace and Electronics Conference (NAECON)
- Blade-type phase-change random access memory technology, challenge and prospectWeikun Xie, Lei Wang, Long Chen, Houjun Wang · 2023 · IEICE Electronics Express
- ReARTSim: an ReRAM ARray Transient Simulator with GPU optimized runtime accelerationYu Feng Sui, Tianhe Yu, Shiming Song · 2024 · Neuromorphic Computing and Engineering
- Investigation of degradation under arbitrary bias conditions in HfO 2 based nanosheet nFETs by 3D kinetic Monte-Carlo methodWangyong Chen, Linlin Cai, Yun Li, Kunliang Wang, Xing Zhang, Xiaoyan Liu, Gang Du · 2019 · Japanese Journal of Applied Physics
- 85% endurance error reduction and data-retention lifetime enhancement by changing the reset voltage in 40 nm TaO X -based ReRAMHiroshi Kinoshita, Tsubasa Yonai, Ken Takeuchi · 2020 · Japanese Journal of Applied Physics
- Addressing crosstalk in crossbar memory arrays with a resistive switching ZnO homojunction diodePunya Mainali, Lyndon D. Bastatas, Elena M. Echeverria, Phadindra Wagle, P. Sankaran, D. McIlroy · 2021 · Journal of Applied Physics
- A Physics-based Compact Model for Set Process of Resistive Random Access Memory (RRAM) with Graphene ElectrodeXingyu Zhai, Wen‐Yan Yin, Yanbin Yang, Wenchao Chen · 2022 · Photonics & Electromagnetics Research Symposium (PIERS)
- Heteroscedastic Gaussian Process Regression for ReRAM Device ModelingImtiaz Hossen, Yi Zang, Mark A. Anders, Lin Wang, Gina C. Adam · 2022 · IEEE Electron Devices Technology & Manufacturing Conference (EDTM)
- Pragmatic OxRAM compact model ready to use for design studiesJ. Lacord, C. Cagli, Jury Sandrini · 2023 · Solid-State Electronics
- Fabrication and characterization of memory devices based on nanoparticlesAsal Kiazadeh · 2013 · Portuguese National Funding Agency for Science, Research and Technology (RCAAP Project by FCT)
- In-situ learning harnessing intrinsic resistive memory variability through Markov Chain Monte Carlo SamplingThomas Dalgaty, N. Castellani, Damien Querlioz, Elisa Vianello · 2020 · arXiv (Cornell University)
- Level Scaling and Pulse Regulating Methods to Mitigate Cycle-to-cycle Variation in Memristor Based Learning SystemZhiheng Liao, Jingyan Fu, Jinhui Wang · 2020 · Research Square
- Theoretical and Experimental Approaches to Select Resistive Switching MaterialTakeki Ninomiya, Zhiqiang Wei, Shinichi Yoneda, Kenji Shiraishi · 2015 · IEICE Transactions on Electronics
- Pulse-train measurement techniques: An RRAM test vehicle for in-depth physical understandingLiang Zhao, Yoshio Nishi · 2014 · IEEE International Conference on Solid-State and Integrated Circuit Technology
- Emerging non-volatile memory based physical unclonable functionsLe Zhang · 2016
- The statistics of set time of oxide-based resistive switching memoryMeiyun Zhang, Shibing Long, Guo‐Ming Wang, Zhaoan Yu, Yang Li, Dinglin Xu, Hangbing Lv, Qi Liu, Enrique A. Miranda, Jordi Suñé et al. · 2016 · IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)
- Evaulation the degradation in nMOSFETs with HfO2 gate dielectric and interfacial layer by 3D Kinetic Monte-Carlo methodYun Li, Zhiyuan Lun, Yijiao Wang, Peng Cheng Huang, Hai Jiang, Xing Zhang, Gang Du, Xiaoyan Liu · 2016 · IEEE Silicon Nanoelectronics Workshop
- Device applications of transition metal oxide thin filmsHua Kai Li · 2016
- Performance Demands for Future NVMRoberto Gastaldi · 2017 · Springer eBooks
- Associative search using pseudo-analog memristorsMika Laiho, Mika Grönroos, Jussi H. Poikonen, Eero Lehtonen, Reon Katsumura, Atsushi Tsurumaki‐Fukuchi, 有田正志, Yasuo Takahashi · 2017 · IEEE International Symposium on Circuits and Systems proceedings
- Physical Models for Resistive Switching DevicesLuis‐Miguel Procel‐Moya · 2018 · InTech eBooks
- Compact Modeling of I-V Characteristics, Temperature Dependency, Variations, and Noise of Integrated, Reproducible Metal-Oxide MemristorsHussein Nili, Adrien F. Vincent, M. Prezioso, Mohammad Reza Mahmoodi, Irina Kataeva, Dmitri B. Strukov · 2018 · arXiv (Cornell University)
- Filamentary-based Resistance Switching RRAM Devices for Memory ApplicationsM. Pawlikiewicz · 2017 · Digital Collections of Colorado (Colorado State University)
- Ensemble Monte-Carlo simulation of resistive switching in HfO2/TaN/TiN stackOlga Permiakova, Andrey V. Miakonkikh, Konstantin V. Rudenko, Alexander E. Rogozhin · 2020 · International Conference on Information Technology and Nanotechnology (ITNT)
- Impact of Nanopillar-Type Electrode on HFOx -Based RRAM PerformanceBaotong Zhang, Xiaokang Li, Yuancheng Yang, Haixia Li, Ru Huang, Ming Li, Pei-Min Lu · 2020 · China Semiconductor Technology International Conference (CSTIC)
- RRAM Device Characterizations and ModellingPeng Cheng Huang, Bin Gao, Jinfeng Kang · 2021 · Springer eBooks
- Designing energy-efficient sub-threshold logic circuits using equalization and non-volatile memory circuits using memristorsZangeneh, Mahmoud, Ajay Joshi · 2014
- Filamentary physics and modelling in redox-based resistive devicesDesmond JiaJun Loy · 2020
- Resistive-Switching MemoriesPeng Cheng Huang, Yudi Zhao, Jinfeng Kang · 2022 · Springer handbooks
- Physical Constraints for Ideal MemelementsMassimiliano Di Ventra, Yuriy V. Pershin · 2023 · SpringerBriefs in physics
- Improved uniformity of xanthan gum resistive memory device by lowering activation energyYu‐Chi Chang, Hao‐Jung Liu, Yu‐Min Chang, Hui-Shin Huang, Yuling Chen · 2023 · Applied Physics Express
- Statistical modeling of degradation behavior in Split-Gate Non-Volatile memory devicesS. Mei, L. Luo, Kalya Shubhakar, Nagarajan Raghavan, K. L. Pey · 2023 · Solid-State Electronics
- Frequency-dependent redox-based 1S1R synapse with a short-term plasticity TIO2-based exponential selectorMun Yin Chee · 2023
- Theoretical investigation of performance-improved ferroelectric tunnel junction based on trap-assisted tunnelingShi-Xi Kong, Tuo‐Hung Hou · 2025 · Applied Physics Letters
- Current-controlled memristive synapse for optimized and energy-efficient neuroprocessorHritom Das, Maximilian Liehr, Nathaniel C. Cady, Garrett S. Rose · 2025 · Elsevier eBooks
- Influence of the Si-Layer Thickness on the Structural, Compositional and Resistive Switching Properties of SiO2/Si/SiO2 Stack Layers for Resistive Switching MemoriesAlfredo Morales-Sánchez, Karla Esther González-Flores, J. Miguel Germán-Martínez, B. Palacios–Márquez, Juan Ramirez-Rios, Javier Flores Méndez, Alfredo Benítez Lara, J. R. Ramos-Serrano, Luis Hernández-Martínez, Mario Moreno · 2025 · Materials
- Optimisation technologique et caractérisation électrique de mémoires résistives OxRRAM pour applications basse consommationT. Cabout · 2014
- Optimisation des mémoires résistives OxRAM à base d’oxydes métalliques pour intégration comme mémoires embarquées dans un nœud technologique CMOS avancéMourad Azzaz · 2017
- Mémoires résistives et technologies 3D monolithiques pour processeurs neuromorphiques impulsionnels et reconfigurablesDenys R. B. Ly · 2020 · theses.fr (ABES)
- Resistive memory co-design in CMOS technologiesHussein Bazzi · 2020
- Investigation of resistive memories for Storage Class Memory applicationsDiego Alfaro Robayo · 2020
- Bayesian neuromorphic computing based on resistive memoryThomas Dalgaty · 2020 · theses.fr (ABES)
- Investigation of resistance fluctuations in ReRAM : physical origin, temporal dependence and impact on memory reliabilityLucas Reganaz · 2024
- Hopping et Tunnelling assisté par pièges dans les mémoires non volatile à base d’oxyde métalliqueNazim Ait Abdelkader · 2024
- Impact of Conductive Filament Rupture Mechanisms in RRAM on Random Telegraph Noise and Its ApplicationsDejiang Mu, Han Lu, Pan Liu, Yujian Zhong, Xiangshui Miao, Xingsheng Wang · 2026 · IEEE International Reliability Physics Symposium proceedings
- An Extended Memristive Switching Uncertainty ModelG. S. Huang, Ben Daniel Rowlinson, Alexander Serb, Shiwei Wang, Themis Prodromakis · 2026 · IEEE Transactions on Electron Devices
- (Ce, Gd) Doped Zn–Mn–Co spinel ferrites: transport and resistive switching properties toward efficient resistive random-access memory devicesHaroon Mazhar, Muhammad Anis-ur-Rehman · 2026 · Journal of Materials Science Materials in Electronics
- Mechanism discrimination in multilevel RRAM using state-resolved impedance evolutionSangwoo Jung, Hyoseob Kim, Kyungho Hong, Sungjoon Kim, Donghyun Ryu, Min-Hwi Kim · 2026 · Materials Horizons
- A Simulation-Based Approach for CMOS-Integrated ReRAM Memory Architecture with Peripheral Circuit DesignG Anusha, Sushanthi Raj, L Prakruthi, G Sandhyashree, S Jamuna · 2026 · International Conference on VLSI Circuits and Systems (ICVCS)
- Variability in Al2O3-based resistive memories: A kinetic Monte Carlo approachA. Hernandez Lopez, Antonio Cantudo, F. Jiménez-Molinos, Mireia Bargalló González, JB Roldan, Marco Antonio Villena · 2026 · Materials Today Communications
- Structural, dielectric, electrical and modulus spectroscopic investigation of Mg-doped CoFe2O4 spinel ferrites for advanced memory storage applicationsHaroon Mazhar, Irsa Kanwal Abbasi, M Anis-ur -Rehman · 2026 · Materials Research Bulletin