Cited by 37Planetary Science and ExplorationAstro and Planetary ScienceSoil Moisture and Remote Sensing

Brightness Temperature Calculation of Lunar Crater: Interpretation of Topographic Effect on Microwave Data From Chang'E

Guoping Hu, Ke Chen, Quanliang Huang, Wei Guo, Qingxia Li, Liangqi Gui, Yingbiao Cheng·2014·IEEE Transactions on Geoscience and Remote Sensing

Abstract

In order to quantitatively interpret topographic effect on Chang'E (CE) microwave data, a detailed method to compute brightness temperature (TB) over a lunar crater is proposed, which incorporated the effect of surface tilts. The method improves the effective solar irradiance model of the lunar surface to obtain the temperature profile of the lunar crater. The calculated TB at 37 GHz with the proposed computation method, which is based on three digital elevation models (DEMs) from different sources, are consistent with the observed TB from the CE-2 microwave radiometer. The simulated behavior of TB across crater Hercules reproduces the TB undulation observed by CE in a single swath. TB is significantly affected by the lunar dust of a lunar crater and affected by albedo and emissivity in a lesser degree. Based on the explanation with simplified models, the TB variation over a crater is proved to be significantly affected, through physical temperature, by the crater shape described by DEMs. With the simplified crater model, the amplitude of the TB oscillatory curves is proved to depend on the crater shape.

Integrity signals

Registry

Crossref · 10.1109/tgrs.2013.2282342

Cites

1 of 1 references verified0 citation errors · 0 not checkable

Statistics

Recomputing p-values needs the paper’s full text.

Claims the paper makes

This paper’s full text isn’t openly available, so its claims and self-check weren’t run. The registry and citation checks still apply.

Cites

Flagged first, then by citations

Cited by

Sorted by citations

Authors
Hu, G., Chen, K., Huang, Q., Guo, W., Li, Q., Gui, L., & Cheng, Y.
Affiliations
  • Huazhong University of Science and Technology (CN)
  • Wuhan Ship Development & Design Institute (CN)
Venue
IEEE Transactions on Geoscience and Remote Sensing
Published
2014-08
Volume
52
Issue
8
Pages
4499-4510
ISSN
  • 0196-2892 (ISSN-L)
  • 1558-0644
OpenAlex
W1974476729
Cited by
37
References
1
Citations by year
2026: 3 · 2025: 5 · 2024: 3 · 2023: 3 · 2022: 1 · 2021: 3 · 2020: 3 · 2019: 2 · 2018: 5 · 2017: 2 · 2016: 1 · 2015: 5 · 2014: 1
FWCI
1.26
Type
journal article
Language
en
Open access
closed
Locations
IEEE Transactions on Geoscience and Remote Sensing (publishedVersion)
Funders
  • National High Technology Research and Development Program of China (863 Program) (2010AA122200)
  • National Natural Science Foundation of China (41001195, 40971185, 41176156, 41275032)
  • Foundation for Independent Innovation (2011QN029)
Topics
  • Physical Sciences › Physics and Astronomy › Astronomy and Astrophysics › Planetary Science and Exploration
  • Physical Sciences › Physics and Astronomy › Astronomy and Astrophysics › Astro and Planetary Science
  • Physical Sciences › Environmental Science › Environmental Engineering › Soil Moisture and Remote Sensing
Keywords
lunar craters, brightness temperature, topographic effects, 37 GHz, surface tilt, digital elevation model, lunar dust, albedo, emissivity

About these checks

Registry, retraction, Cites and statistics results are computed, not judged, with one exception: a printed reference that no index lists is read once by a model before it counts as a citation error. Claims are extracted by a model and kept only when their quote appears verbatim in the text; each cited source is then checked, with a model’s help, for whether it says what the claim relies on. Those verdicts can be wrong — read the claim’s quote and the cited source before relying on one.

Statistics and arithmetic are recomputed, not judged.

Confidence bands are shown only for fields calibrated on our annotated test set. None is calibrated yet, so no band is shown.

What counts as a claim ›How we measure confidence ›How we check this ›

Are you an author, or do you see a problem with this page? Request a review