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The DOI matches its Crossref record; 18 of the 18 references it cites were found in a registry or an index.

Performance-Driven Distributed PCA Process Monitoring Based on Fault-Relevant Variable Selection and Bayesian Inference

Jiang, Qingchao, Yan, Xuefeng, Huang, Biao·2016·IEEE Transactions on Industrial Electronics

Abstract

Multivariate statistical process monitoring involves dimension reduction and latent feature extraction in large-scale processes and typically incorporates all measured variables. However, involving variables without beneficial information may degrade monitoring performance. This study analyzes the effect of variable selection on principal component analysis (PCA) monitoring performance. Then, it proposes a fault-relevant variable selection and Bayesian inference-based distributed method for efficient fault detection and isolation. First, the optimal subset of variables is identified for each fault using an optimization algorithm. Second, a sub-PCA model is established in each subset. Finally, the monitoring results of all of the subsets are combined through Bayesian inference. The proposed method reduces redundancy and complexity, explores numerous local behaviors, and provides accurate description of faults, thus improving monitoring performance significantly. Case studies on a numerical example, the Tennessee Eastman benchmark process, and an industrial-scale plant demonstrate the efficiency.

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Metadata

Authors
Jiang, Q., Yan, X., & Huang, B.
Venue
IEEE Transactions on Industrial Electronics
Published
2016-01
Volume
63
Issue
1
Pages
377-386
ISSN
  • 0278-0046 (ISSN-L)
  • 1557-9948
OpenAlex
W2201427885
Cited by
361
References
18
FWCI
23.82
Type
journal article
Language
en
Open access
closed

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CoChat. (2026). Citation check: Performance-Driven Distributed PCA Process Monitoring Based on Fault-Relevant Variable Selection and Bayesian Inference. https://app.cochat.ai/papers/10.1109/tie.2015.2466557
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Jiang, Q., Yan, X., & Huang, B. (2016). Performance-Driven Distributed PCA Process Monitoring Based on Fault-Relevant Variable Selection and Bayesian Inference. IEEE Transactions on Industrial Electronics. https://doi.org/10.1109/tie.2015.2466557

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Contains information from the Semantic Scholar Academic Graph Datasets, made available under the ODC Attribution License (ODC-BY 1.0).

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