The DOI matches its Crossref record; 29 of the 29 references it cites were found in a registry or an index.
Highly Accurate Machine Fault Diagnosis Using Deep Transfer Learning
Abstract
We develop a novel deep learning framework to achieve highly accurate machine fault diagnosis using transfer learning to enable and accelerate the training of deep neural network. Compared with existing methods, the proposed method is faster to train and more accurate. First, original sensor data are converted to images by conducting a Wavelet transformation to obtain time-frequency distributions. Next, a pretrained network is used to extract lower level features. The labeled time-frequency images are then used to fine-tune the higher levels of the neural network architecture. This paper creates a machine fault diagnosis pipeline and experiments are carried out to verify the effectiveness and generalization of the pipeline on three main mechanical datasets including induction motors, gearboxes, and bearings with sizes of 6000, 9000, and 5000 time series samples, respectively. We achieve state-of-the-art results on each dataset, with most datasets showing test accuracy near 100%, and in the gearbox dataset, we achieve significant improvement from 94.8% to 99.64%. We created a repository including these datasets located at mlmechanics.ics.uci.edu.
Overview
The claims and statistics of this paper haven’t been checked yet.
Run the check — free, no account needed. It reads the open-access text and checks the sources it cites.
Integrity signals
Registry
Cites
Statistics
Verification
Claims the paper makes
The claims and statistics of this paper haven’t been checked yet.
Run the check — free, no account needed. It reads the open-access text and checks the sources it cites.
Self-check
Percentages, sums and reported differences re-computed from the paper’s own numbers.
The self-check needs the paper’s full text.
Citations
Cites
Very Deep Convolutional Networks for Large-Scale Image Recognition
Simonyan, K., & Zisserman, A. (2014) · arXiv · doi:10.48550/arxiv.1409.1556 · Cited by 114,148
ImageNet classification with deep convolutional neural networks
Krizhevsky, A., Sutskever, I., & Hinton, G. E. (2017) · Communications of the ACM · doi:10.1145/3065386 · Cited by 112,155
Pan, S. J., & Yang, Q. (2010) · IEEE Transactions on Knowledge and Data Engineering · doi:10.1109/tkde.2009.191 · Cited by 23,387
Deep learning in neural networks: an overview
Schmidhuber, J. (2015) · Neural Networks · doi:10.1016/j.neunet.2014.09.003 · Cited by 18,570
Hinton, G., Deng, L., Yu, D., Dahl, G., Mohamed, A.-R., Jaitly, N., Senior, A., Vanhoucke, V., Nguyen, P., Sainath, T., et al. (2012) · IEEE Signal Processing Magazine · doi:10.1109/msp.2012.2205597 · Cited by 10,260
Recent advances in convolutional neural networks
Gu, J., Wang, Z., Kuen, J., Ma, L., Shahroudy, A., Shuai, B., Liu, T., Wang, X., Wang, G., Cai, J., et al. (2018) · Pattern Recognition · doi:10.1016/j.patcog.2017.10.013 · Cited by 6,576
Improving neural networks by preventing co-adaptation of feature detectors
Hinton, G. E., Srivastava, N., Krizhevsky, A., Sutskever, I., & Salakhutdinov, R. R. (2012) · arXiv · doi:10.48550/arxiv.1207.0580 · Cited by 6,382
Wavelets for fault diagnosis of rotary machines: A review with applications
Yan, R., Gao, R. X., & Chen, X. (2014) · Signal Processing · doi:10.1016/j.sigpro.2013.04.015 · Cited by 1,446
Self-citationTime-Frequency Signal Analysis and Processing
(2016) · doi:10.1016/c2012-0-00024-5 · Cited by 1,340
Lei, Y., Jia, F., Lin, J., Xing, S., & Ding, S. X. (2016) · IEEE Transactions on Industrial Electronics · doi:10.1109/tie.2016.2519325 · Cited by 1,191
Cited by
Applications of machine learning to machine fault diagnosis: A review and roadmap
Lei, Y., Yang, B., Jiang, X., Jia, F., Li, N., & Nandi, A. K. (2020) · Mechanical Systems and Signal Processing · doi:10.1016/j.ymssp.2019.106587 · Cited by 2,997
Zhao, Z., Li, T., Wu, J., Sun, C., Wang, S., Yan, R., & Chen, X. (2020) · ISA Transactions · doi:10.1016/j.isatra.2020.08.010 · Cited by 688
Self-citationFink, O., Wang, Q., Svensén, M., Dersin, P., Lee, W.-J., & Ducoffe, M. (2020) · Engineering Applications of Artificial Intelligence · doi:10.1016/j.engappai.2020.103678 · Cited by 549
Shao, H., Xia, M., Han, G., Zhang, Y., & Wan, J. (2021) · IEEE Transactions on Industrial Informatics · doi:10.1109/tii.2020.3005965 · Cited by 452
Fault Description Based Attribute Transfer for Zero-Sample Industrial Fault Diagnosis
Feng, L., & Zhao, C. (2021) · IEEE Transactions on Industrial Informatics · doi:10.1109/tii.2020.2988208 · Cited by 395
Metadata
- Authors
- Shao, S., McAleer, S., Yan, R., & Baldi, P.
- Venue
- IEEE Transactions on Industrial Informatics
- Published
- 2019-04
- Volume
- 15
- Issue
- 4
- Pages
- 2446-2455
- ISSN
- 1551-3203 (ISSN-L)
- 1941-0050
- OpenAlex
- W2887782657
- Cited by
- 1,635
- References
- 29
- FWCI
- 52.75
- Type
- journal article
- Language
- en
- Open access
- closed
About these checks
Registry, retraction, Cites and statistics results are computed, not judged, with one exception: a printed reference that no index lists is read once by a model before it counts as a citation error. Claims are extracted by a model and kept only when their quote appears verbatim in the text; each cited source is then checked, with a model’s help, for whether it says what the claim relies on. Those verdicts can be wrong — read the claim’s quote and the cited source before relying on one.
Statistics and arithmetic are recomputed, not judged.
Confidence bands are shown only for fields calibrated on our annotated test set. None is calibrated yet, so no band is shown.
What counts as a claim ›How we measure confidence ›How we check this ›
Are you an author, or do you see a problem with this page? Request a review
How to cite
Cite CoChat for the checks on this page, and the paper for its own findings.
- This page
- CoChat. (2026). Citation check: Highly Accurate Machine Fault Diagnosis Using Deep Transfer Learning. https://app.cochat.ai/papers/10.1109/tii.2018.2864759
- The paper
- Shao, S., McAleer, S., Yan, R., & Baldi, P. (2019). Highly Accurate Machine Fault Diagnosis Using Deep Transfer Learning. IEEE Transactions on Industrial Informatics. https://doi.org/10.1109/tii.2018.2864759
Data sources
Bibliographic data: Semantic Scholar, OpenAlex, Crossref.
Contains information from the Semantic Scholar Academic Graph Datasets, made available under the ODC Attribution License (ODC-BY 1.0).
Semantic Scholar’s data is described in: Kinney, R., et al. (2023). The Semantic Scholar Open Data Platform. arXiv:2301.10140.