The DOI matches its Crossref record; 7 of the 7 references it cites were found in a registry or an index.
Triplet-Graph Reasoning Network for Few-Shot Metal Generic Surface Defect Segmentation
Abstract
Metal surface defect segmentation can play an important role in dealing with the issue of quality control during the production and manufacturing stages. There are still two major challenges in industrial applications. One is the case that the number of metal surface defect samples is severely insufficient, and the other is that the most existing algorithms can only be used for specific surface defects and it is difficult to generalize to other metal surfaces. In this work, a theory of few-shot metal generic surface defect segmentation is introduced to solve these challenges. Simultaneously, the Triplet-Graph Reasoning Network (TGRNet) and a novel dataset Surface Defects- 4iare proposed to achieve this theory. In our TGRNet, the surface defect triplet (including triplet encoder and trip loss) is proposed and is used to segment background and defect area, respectively. Through triplet, the few-shot metal surface defect segmentation problem is transformed into few-shot semantic segmentation problem of defect area and background area. For few-shot semantic segmentation, we propose a method of multi-graph reasoning to explore the similarity relationship between different images. And to improve segmentation performance in the industrial scene, an adaptive auxiliary prediction module is proposed. For Surface Defects- 4i, it includes multiple categories of metal surface defect images to verify the generalization performance of our TGRNet and adds the nonmetal categories (leather and tile) as extensions. Through extensive comparative experiments and ablation experiments, it is proved that our architecture can achieve state-of-the-art results.
Overview
The claims and statistics of this paper haven’t been checked yet.
Run the check — free, no account needed. It reads the open-access text and checks the sources it cites.
Integrity signals
Registry
Cites
Statistics
Verification
Claims the paper makes
The claims and statistics of this paper haven’t been checked yet.
Run the check — free, no account needed. It reads the open-access text and checks the sources it cites.
Self-check
Percentages, sums and reported differences re-computed from the paper’s own numbers.
The self-check needs the paper’s full text.
Citations
Cites
An End-to-End Steel Surface Defect Detection Approach via Fusing Multiple Hierarchical Features
He, Y., Song, K., Meng, Q., & Yan, Y. (2020) · IEEE Transactions on Instrumentation and Measurement · doi:10.1109/tim.2019.2915404 · Cited by 1,341 · cited 1×
“For quantitative metal surface defect inspection, there are two main different network architectures, detection network [6], [7] and segmentation network [8], [9].”
BackgroundSelf-citationDo Better ImageNet Models Transfer Better?
Kornblith, S., Shlens, J., & Le, Q. V. (2019) · 2019 IEEE/CVF Conference on Computer Vision and Pattern Recognition (CVPR) · doi:10.1109/cvpr.2019.00277 · Cited by 1,325
Automated Visual Defect Detection for Flat Steel Surface: A Survey
Luo, Q., Fang, X., Liu, L., Yang, C., & Sun, Y. (2020) · IEEE Transactions on Instrumentation and Measurement · doi:10.1109/tim.2019.2963555 · Cited by 559 · cited 1×
“For quantitative metal surface defect inspection, there are two main different network architectures, detection network [6], [7] and segmentation network [8], [9].”
BackgroundAutomated Visual Defect Classification for Flat Steel Surface: A Survey
Luo, Q., Fang, X., Su, J., Zhou, J., Zhou, B., Yang, C., Liu, L., Gui, W., & Tian, L. (2020) · IEEE Transactions on Instrumentation and Measurement · doi:10.1109/tim.2020.3030167 · Cited by 148
Surface Defect Saliency of Magnetic Tile
Huang, Y., Qiu, C., Guo, Y., Wang, X., & Yuan, K. (2018) · 2018 IEEE 14th International Conference on Automation Science and Engineering (CASE) · doi:10.1109/coase.2018.8560423 · Cited by 117
Fully Convolutional Networks for Surface Defect Inspection in Industrial Environment
Yu, Z., Wu, X., & Gu, X. (2017) · Lecture Notes in Computer Science · doi:10.1007/978-3-319-68345-4_37 · Cited by 77
Multiscale fully convolutional network with application to industrial inspection
Bian, X., Lim, S. N., & Zhou, N. (2016) · 2016 IEEE Winter Conference on Applications of Computer Vision (WACV) · doi:10.1109/wacv.2016.7477595 · Cited by 72
Cited by
Zeng, N., Wu, P., Wang, Z., Li, H., Liu, W., & Liu, X. (2022) · IEEE Transactions on Instrumentation and Measurement · doi:10.1109/tim.2022.3153997 · Cited by 523
Surface Defect Detection Methods for Industrial Products: A Review
Chen, Y., Ding, Y., Zhao, F., Zhang, E., Wu, Z., & Shao, L. (2021) · Applied Sciences · doi:10.3390/app11167657 · Cited by 457
Metadata
- Authors
- Bao, Y., Song, K., Liu, J., Wang, Y., Yan, Y., Yu, H., & Li, X.
- Venue
- IEEE Transactions on Instrumentation and Measurement
- Published
- 2021
- Volume
- 70
- Pages
- 1-11
- ISSN
- 0018-9456 (ISSN-L)
- 1557-9662
- OpenAlex
- W3164289800
- Cited by
- 319
- References
- 7
- FWCI
- 23.36
- Type
- journal article
- Language
- en
- Open access
- closed
About these checks
Registry, retraction, Cites and statistics results are computed, not judged, with one exception: a printed reference that no index lists is read once by a model before it counts as a citation error. Claims are extracted by a model and kept only when their quote appears verbatim in the text; each cited source is then checked, with a model’s help, for whether it says what the claim relies on. Those verdicts can be wrong — read the claim’s quote and the cited source before relying on one.
Statistics and arithmetic are recomputed, not judged.
Confidence bands are shown only for fields calibrated on our annotated test set. None is calibrated yet, so no band is shown.
What counts as a claim ›How we measure confidence ›How we check this ›
Are you an author, or do you see a problem with this page? Request a review
How to cite
Cite CoChat for the checks on this page, and the paper for its own findings.
- This page
- CoChat. (2026). Citation check: Triplet-Graph Reasoning Network for Few-Shot Metal Generic Surface Defect Segmentation. https://app.cochat.ai/papers/10.1109/tim.2021.3083561
- The paper
- Bao, Y., Song, K., Liu, J., Wang, Y., Yan, Y., Yu, H., & Li, X. (2021). Triplet-Graph Reasoning Network for Few-Shot Metal Generic Surface Defect Segmentation. IEEE Transactions on Instrumentation and Measurement. https://doi.org/10.1109/tim.2021.3083561
Data sources
Bibliographic data: Semantic Scholar, OpenAlex, Crossref.
Contains information from the Semantic Scholar Academic Graph Datasets, made available under the ODC Attribution License (ODC-BY 1.0).
Semantic Scholar’s data is described in: Kinney, R., et al. (2023). The Semantic Scholar Open Data Platform. arXiv:2301.10140.