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On optimum recognition error and reject tradeoff

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Chow, C.·1970·IEEE Transactions on Information Theory

Abstract

The performance of a pattern recognition system is characterized by its error and reject tradeoff. This paper describes an optimum rejection rule and presents a general relation between the error and reject probabilities and some simple properties of the tradeoff in the optimum recognition system. The error rate can be directly evaluated from the reject function. Some practical implications of the results are discussed. Examples in normal distributions and uniform distributions are given.

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Metadata

Authors
Chow, C.
Venue
IEEE Transactions on Information Theory
Published
1970-01
Volume
16
Issue
1
Pages
41-46
ISSN
  • 0018-9448 (ISSN-L)
  • 1557-9654
OpenAlex
W2118377301
Cited by
929
References
0
FWCI
6.25
Type
journal article
Language
en
Open access
green

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CoChat. (2026). Citation check: On optimum recognition error and reject tradeoff. https://app.cochat.ai/papers/10.1109/tit.1970.1054406
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Chow, C. (1970). On optimum recognition error and reject tradeoff. IEEE Transactions on Information Theory. https://doi.org/10.1109/tit.1970.1054406

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Semantic Scholar’s data is described in: Kinney, R., et al. (2023). The Semantic Scholar Open Data Platform. arXiv:2301.10140.