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BELM: Bayesian Extreme Learning Machine

Soria-Olivas, E, Gomez-Sanchis, J, Martin, J D, Vila-Frances, J, Martinez, M, Magdalena, J R, Serrano, A J·2011·IEEE Transactions on Neural Networks

Abstract

The theory of extreme learning machine (ELM) has become very popular on the last few years. ELM is a new approach for learning the parameters of the hidden layers of a multilayer neural network (as the multilayer perceptron or the radial basis function neural network). Its main advantage is the lower computational cost, which is especially relevant when dealing with many patterns defined in a high-dimensional space. This brief proposes a bayesian approach to ELM, which presents some advantages over other approaches: it allows the introduction of a priori knowledge; obtains the confidence intervals (CIs) without the need of applying methods that are computationally intensive, e.g., bootstrap; and presents high generalization capabilities. Bayesian ELM is benchmarked against classical ELM in several artificial and real datasets that are widely used for the evaluation of machine learning algorithms. Achieved results show that the proposed approach produces a competitive accuracy with some additional advantages, namely, automatic production of CIs, reduction of probability of model overfitting, and use of a priori knowledge.

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Metadata

Authors
Soria-Olivas, E., Gomez-Sanchis, J., Martin, J. D., Vila-Frances, J., Martinez, M., Magdalena, J. R., & Serrano, A. J.
Venue
IEEE Transactions on Neural Networks
Published
2011-03
Volume
22
Issue
3
Pages
505-509
ISSN
  • 1045-9227 (ISSN-L)
  • 1941-0093
OpenAlex
W2136602355
Cited by
163
References
1
FWCI
10.35
Type
journal article
Language
en
Open access
closed

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CoChat. (2026). Citation check: BELM: Bayesian Extreme Learning Machine. https://app.cochat.ai/papers/10.1109/tnn.2010.2103956
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Soria-Olivas, E., Gomez-Sanchis, J., Martin, J. D., Vila-Frances, J., Martinez, M., Magdalena, J. R., & Serrano, A. J. (2011). BELM: Bayesian Extreme Learning Machine. IEEE Transactions on Neural Networks. https://doi.org/10.1109/tnn.2010.2103956

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