The DOI matches its Crossref record; 4 of the 4 references it cites were found in a registry or an index.
A New Deep Transfer Learning Based on Sparse Auto-Encoder for Fault Diagnosis
Abstract
Fault diagnosis plays an important role in modern industry. With the development of smart manufacturing, the data-driven fault diagnosis becomes hot. However, traditional methods have two shortcomings: 1) their performances depend on the good design of handcrafted features of data, but it is difficult to predesign these features and 2) they work well under a general assumption: the training data and testing data should be drawn from the same distribution, but this assumption fails in many engineering applications. Since deep learning (DL) can extract the hierarchical representation features of raw data, and transfer learning provides a good way to perform a learning task on the different but related distribution datasets, deep transfer learning (DTL) has been developed for fault diagnosis. In this paper, a new DTL method is proposed. It uses a three-layer sparse auto-encoder to extract the features of raw data, and applies the maximum mean discrepancy term to minimizing the discrepancy penalty between the features from training data and testing data. The proposed DTL is tested on the famous motor bearing dataset from the Case Western Reserve University. The results show a good improvement, and DTL achieves higher prediction accuracies on most experiments than DL. The prediction accuracy of DTL, which is as high as 99.82%, is better than the results of other algorithms, including deep belief network, sparse filter, artificial neural network, support vector machine and some other traditional methods. What is more, two additional analytical experiments are conducted. The results show that a good unlabeled third dataset may be helpful to DTL, and a good linear relationship between the final prediction accuracies and their standard deviations have been observed.
Overview
The claims and statistics of this paper haven’t been checked yet.
Run the check — free, no account needed. It reads the open-access text and checks the sources it cites.
Integrity signals
Registry
Cites
Statistics
Verification
Claims the paper makes
The claims and statistics of this paper haven’t been checked yet.
Run the check — free, no account needed. It reads the open-access text and checks the sources it cites.
Self-check
Percentages, sums and reported differences re-computed from the paper’s own numbers.
The self-check needs the paper’s full text.
Citations
Cites
LeCun, Y., Bengio, Y., & Hinton, G. (2015) · Nature · doi:10.1038/nature14539 · Cited by 84,126
Pan, S. J., & Yang, Q. (2010) · IEEE Transactions on Knowledge and Data Engineering · doi:10.1109/tkde.2009.191 · Cited by 23,387
Deep learning and its applications to machine health monitoring
Zhao, R., Yan, R., Chen, Z., Mao, K., Wang, P., & Gao, R. X. (2019) · Mechanical Systems and Signal Processing · doi:10.1016/j.ymssp.2018.05.050 · Cited by 2,894
Lei, Y., Jia, F., Lin, J., Xing, S., & Ding, S. X. (2016) · IEEE Transactions on Industrial Electronics · doi:10.1109/tie.2016.2519325 · Cited by 1,191
Research works printed but not linked: 37
- ranzato, 2006, Efficient learning of sparse representations with an energy-based model, Proc Adv Neural Inf Process Syst, 1137
- rifai, 2011, Contractive auto-encoders: Explicit invariance during feature extraction, Proc 28th Int Conf Mach Learn (ICML), 833
- bengio, 2012, Deep learning of representations for unsupervised and transfer learning, Proc ICML Workshop Unsupervised Transf Learn, 17
- 10.1007/s00521-016-2325-5 · DOI
- glorot, 2011, Domain adaptation for large-scale sentiment classification: A deep learning approach, Proc 28th Int Conf Mach Learn (ICML), 513
- 10.1109/TCYB.2015.2482970 · DOI
- vincent, 2010, Stacked denoising autoencoders: Learning useful representations in a deep network with a local denoising criterion, J Mach Learn Res, 11, 3371
- 10.1109/TSMC.2016.2637279 · DOI
- 10.1109/TIE.2016.2627020 · DOI · Paper page
- 10.1109/SMC.2014.6974107 · DOI
- gretton, 2007, A kernel method for the two-sample-problem, Proc Adv Neural Inf Process Syst, 513
- 10.1016/j.ymssp.2015.11.014 · DOI · Paper page
- 10.1016/j.ress.2013.02.022 · DOI · Paper page
- 10.1016/j.sigpro.2014.09.009 · DOI
- 10.1109/TIE.2015.2417501 · DOI · Paper page
- henley, 1984, Application of expert systems to fault diagnosis, Proc AIChE Annu Meeting
- 10.1109/TIE.2013.2261033 · DOI
- 10.1016/j.neucom.2015.09.081 · DOI · Paper page
- 10.1109/TII.2008.2008642 · DOI
- 10.1186/s40537-016-0043-6 · DOI · Paper page
- 10.1016/j.ymssp.2014.10.010 · DOI
- 10.1109/TIE.2015.2417501 · DOI · Paper page
- 10.1016/j.ymssp.2010.07.013 · DOI · Paper page
- 10.1109/TNN.2010.2091281 · DOI · Paper page
- 10.1109/JPROC.2015.2388958 · DOI · Paper page
- 10.1016/j.neunet.2014.09.003 · DOI · Paper page
- 10.1109/TPAMI.2013.50 · DOI · Paper page
- 10.1109/TII.2013.2243743 · DOI · Paper page
- 10.1109/TSMC.2016.2605159 · DOI
- 10.1109/TSMC.2016.2585566 · DOI
- 10.1109/TCST.2009.2020863 · DOI
- 10.1016/j.measurement.2016.04.007 · DOI · Paper page
- 10.1088/0957-0233/26/11/115002 · DOI · Paper page
- 10.1016/j.ymssp.2015.04.021 · DOI · Paper page
- 10.1016/j.sigpro.2016.07.028 · DOI · Paper page
- 10.1016/j.knosys.2015.01.010 · DOI · Paper page
- 10.1016/j.ymssp.2015.10.025 · DOI · Paper page
Cited by
Applications of machine learning to machine fault diagnosis: A review and roadmap
Lei, Y., Yang, B., Jiang, X., Jia, F., Li, N., & Nandi, A. K. (2020) · Mechanical Systems and Signal Processing · doi:10.1016/j.ymssp.2019.106587 · Cited by 2,997
A new convolutional neural network-based data-driven fault diagnosis method
Wen, L., Li, X., Gao, L., & Zhang, Y. (2018) · IEEE Transactions on Industrial Electronics · doi:10.1109/tie.2017.2774777 · Cited by 2,222
Self-citationHighly Accurate Machine Fault Diagnosis Using Deep Transfer Learning
Shao, S., McAleer, S., Yan, R., & Baldi, P. (2019) · IEEE Transactions on Industrial Informatics · doi:10.1109/tii.2018.2864759 · Cited by 1,635
Guo, L., Lei, Y., Xing, S., Yan, T., & Li, N. (2019) · IEEE Transactions on Industrial Electronics · doi:10.1109/tie.2018.2877090 · Cited by 1,234
Yang, B., Lei, Y., Jia, F., & Xing, S. (2019) · Mechanical Systems and Signal Processing · doi:10.1016/j.ymssp.2018.12.051 · Cited by 879
Metadata
- Authors
- Wen, L., Gao, L., & Li, X.
- Venue
- IEEE Transactions on Systems, Man, and Cybernetics: Systems
- Published
- 2019-01
- Volume
- 49
- Issue
- 1
- Pages
- 136-144
- ISSN
- 2168-2216 (ISSN-L)
- 2168-2232
- OpenAlex
- W2763583057
- Cited by
- 1,095
- References
- 4
- FWCI
- 47.70
- Type
- journal article
- Language
- en
- Open access
- closed
- Licence
- Funders
- National Natural Science Foundation of China (51435009, 51775216, 51711530038)
- 111 Project (B16019)
About these checks
Registry, retraction, Cites and statistics results are computed, not judged, with one exception: a printed reference that no index lists is read once by a model before it counts as a citation error. Claims are extracted by a model and kept only when their quote appears verbatim in the text; each cited source is then checked, with a model’s help, for whether it says what the claim relies on. Those verdicts can be wrong — read the claim’s quote and the cited source before relying on one.
Statistics and arithmetic are recomputed, not judged.
Confidence bands are shown only for fields calibrated on our annotated test set. None is calibrated yet, so no band is shown.
What counts as a claim ›How we measure confidence ›How we check this ›
Are you an author, or do you see a problem with this page? Request a review
How to cite
Cite CoChat for the checks on this page, and the paper for its own findings.
- This page
- CoChat. (2026). Citation check: A New Deep Transfer Learning Based on Sparse Auto-Encoder for Fault Diagnosis. https://app.cochat.ai/papers/10.1109/tsmc.2017.2754287
- The paper
- Wen, L., Gao, L., & Li, X. (2019). A New Deep Transfer Learning Based on Sparse Auto-Encoder for Fault Diagnosis. IEEE Transactions on Systems, Man, and Cybernetics: Systems. https://doi.org/10.1109/tsmc.2017.2754287
Data sources
Bibliographic data: Semantic Scholar, OpenAlex, Crossref.
Contains information from the Semantic Scholar Academic Graph Datasets, made available under the ODC Attribution License (ODC-BY 1.0).
Semantic Scholar’s data is described in: Kinney, R., et al. (2023). The Semantic Scholar Open Data Platform. arXiv:2301.10140.