Microstructure Analysis of Porous Lead Zirconate–Titanate Films
Abstract
Porous ferroelectric lead zirconate–titanate (PZT) films with different internal structures are synthesized using a sol–gel technique and spin‐on deposition on platinized silicon substrates. The films’ porosity is engineered using various structure‐directing agents: polyvinylpyrrolidone with a molecular weight of 360 000 (1–6.6 wt.%) and block copolymer surfactants Brij 30 and Brij 76 (30–60 wt.%). The films’ structures are characterized by transmission electron microscopy. The PVP‐based films contain large, elongated pores with diameters as large as 100 nm. By contrast, the films prepared from solutions with block copolymers exhibit a small pore size depending on the surfactant molecular weight (10–19 nm for Brij 30 and 20–27 nm for Brij 76), with a mostly uniform distribution of channel‐like pores within the film volume. Despite their highly porous structures, all of the films show a columnar‐grain perovskite structure with grains as large as several micrometers and curved grain boundaries. The films demonstrate ferroelectric behavior with dielectric hysteresis, and their permittivity decreases with increasing porosity. Thus, the Brij 30 and Brij 76 copolymer surfactants can be used to engineer fine porous structures in PZT films for various applications in electronics.
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Columnar grain growth in CSD films is usually caused by heterogeneous nucleation at the film-substrate interface.
“Columnar grain growth in CSD films is usually caused by heterogeneous nucleation at the film–substrate interface [34,35,36,37,38,39,40,41,42,43,44,45].”
From Control of Columnar Grain Microstructure in CSD LaNiO3 Films (2023) · cites this paper as [36]
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Control of Columnar Grain Microstructure in CSD LaNiO3 Films
Atanova, A. V., Seregin, D. S., Zhigalina, O. M., Khmelenin, D. N., Orlov, G. A., Turkina, D. I., Sigov, A. S., & Vorotilov, K. A. (2023) · Molecules · doi:10.3390/molecules28041938 · Cited by 5 · see citing works
Self-citation
- Authors
- Atanova, A. V., Zhigalina, O. M., Khmelenin, D. N., Orlov, G. A., Seregin, D. S., Sigov, A. S., & Vorotilov, K. A.
- Affiliations
- Federal Scientific Research Center “Crystallography and Photonics,” of Russian Academy of Sciences Moscow Russia
- Russian Academy of Sciences (RU)
- MIREA - Russian Technological University (RU)
- ORCID
- Venue
- Journal of the American Ceramic Society
- Publisher
- Wiley
- Published
- 2021-08-11
- Volume
- 105
- Issue
- 1
- Pages
- 639-652
- ISSN
- 0002-7820 (ISSN-L)
- 1551-2916
- OpenAlex
- W3191410432
- Cited by
- 15
- References
- 0
- Citations by year
- 2026: 4 · 2025: 3 · 2024: 2 · 2023: 4 · 2022: 2
- FWCI
- 0.61
- Type
- journal article
- Language
- en
- Open access
- closed
- Locations
- Journal of the American Ceramic Society (publishedVersion)
- Funders
- Ministry of Science and Higher Education of the Russian Federation (0706‐2020‐0022)
- Russian Foundation for Basic Research (19‐29‐03058, 20‐32‐90056)
- Topics
- Physical Sciences › Materials Science › Materials Chemistry › Ferroelectric and Piezoelectric Materials
- Physical Sciences › Engineering › Biomedical Engineering › Dielectric materials and actuators
- Physical Sciences › Engineering › Electrical and Electronic Engineering › Ferroelectric and Negative Capacitance Devices
- Keywords
- PZT thin films, ferroelectric thin films, microstructure, porosity engineering, structure-directing agent, polyvinylpyrrolidone, block copolymer surfactants, Brij 30, pore size, columnar grains, perovskite structure, dielectric hysteresis, dielectric constant
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