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Mueller matrix imaging polarimetry
Abstract
The design and operation of a Mueller matrix imaging polarimeter is presented. The instrument is configurable to make a wide variety of polarimetric measurements of optical systems and samples. In one configuration, it measures the polarization properties of a set of ray paths through a sample. The sample may comprise a single element, such as a lens, polarizer, retarder, spatial light modulator, or beamsplitter, or an entire optical system containing many elements. In a second configuration, it measures an optical system's point spread matrix, a Mueller matrix relating the polarization state of a point object to the distribution of intensity and polarization across the image. The instrument is described and a number of example measurements are provided that demonstrate the Mueller matrix imaging polarimeter's unique measurement capability.
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Citations
Cited by
Tyo, J. S. (2002) · Applied Optics · doi:10.1364/ao.41.000619 · Cited by 347
Techniques for fast and sensitive measurements of two-dimensional birefringence distributions
Shribak, M., & Oldenbourg, R. (2003) · Applied Optics · doi:10.1364/ao.42.003009 · Cited by 324
Gil, J. J. (2007) · The European Physical Journal Applied Physics · doi:10.1051/epjap:2007153 · Cited by 272
Metadata
- Authors
- Pezzaniti, J. L.
- Venue
- Optical Engineering
- Publisher
- SPIE-Intl Soc Optical Eng
- Published
- 1995-06-01
- Volume
- 34
- Issue
- 6
- Pages
- 1558
- ISSN
- 0091-3286 (ISSN-L)
- OpenAlex
- W2168499395
- Cited by
- 193
- References
- 0
- FWCI
- 1.93
- Type
- journal article
- Language
- en
- Open access
- closed
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- Pezzaniti, J. L. (1995). Mueller matrix imaging polarimetry. Optical Engineering. https://doi.org/10.1117/12.206161
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Bibliographic data: Semantic Scholar, OpenAlex, Crossref.
Contains information from the Semantic Scholar Academic Graph Datasets, made available under the ODC Attribution License (ODC-BY 1.0).
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