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Laterally modulated excitation microscopy: improvement of resolution by using a diffraction grating:
Abstract
High spatial frequencies in the illuminating light of microscopes lead to a shift of the object spatial frequencies detectable through the objective lens. If a suitable procedure is found for evaluation of the measured data, a microscopic image with a higher resolution than under flat illumination can be obtained. A simple method for generation of a laterally modulated illumination pattern is discussed here. A specially constructed diffraction grating was inserted in the illumination beam path at the conjugate object plane (position of the adjustable aperture) and projected through the objective into the object. Microscopic beads were imaged with this method and evaluated with an algorithm based on the structure of the Fourier space. The results indicate an improvement of resolution.
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Citations
Cited by
Gustafsson, M. G. L. (2000) · Journal of Microscopy · doi:10.1046/j.1365-2818.2000.00710.x · Cited by 3,786
A guide to super-resolution fluorescence microscopy
Schermelleh, L., Heintzmann, R., & Leonhardt, H. (2010) · Journal of Cell Biology · doi:10.1083/jcb.201002018 · Cited by 1,255
Self-citationSuper-Resolution Structured Illumination Microscopy
Heintzmann, R., & Huser, T. (2017) · Chemical Reviews · doi:10.1021/acs.chemrev.7b00218 · Cited by 574
Self-citationParameter-free image resolution estimation based on decorrelation analysis
Descloux, A., Grußmayer, K. S., & Radenovic, A. (2019) · Nature Methods · doi:10.1038/s41592-019-0515-7 · Cited by 363
Stimulated Emission Depletion Microscopy
Blom, H., & Widengren, J. (2017) · Chemical Reviews · doi:10.1021/acs.chemrev.6b00653 · Cited by 339
Metadata
- Authors
- Heintzmann, R., & Cremer, C. G.
- Venue
- SPIE Proceedings
- Publisher
- SPIE
- Published
- 1999-01-19
- Volume
- 3568
- Pages
- 185-196
- ISSN
- 0277-786X (ISSN-L)
- OpenAlex
- W2075119852
- Cited by
- 589
- References
- 0
- FWCI
- 23.85
- Type
- conference paper
- Language
- en
- Open access
- closed
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- Heintzmann, R., & Cremer, C. G. (1999). Laterally modulated excitation microscopy: improvement of resolution by using a diffraction grating:. SPIE Proceedings. https://doi.org/10.1117/12.336833
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