Analysis of measurement uncertainty in THz-TDS
Abstract
Measurement precision is often required in the process of material parameter extraction. This fact is applicable to terahertz time-domain spectroscopy (THz-TDS), which is able to determine the optical/dielectric constants of material in the T-ray regime. Essentially, an ultrafast-pulsed THz-TDS system is composed of several mechanical, optical, and electronic parts, each of which is limited in precision. In operation, the uncertainties of these parts, along with the uncertainties introduced during the parameter extraction process, contribute to the overall uncertainty appearing at the output, i.e. the uncertainty in the extracted optical constants. This paper analyzes the sources of uncertainty and models error propagation through the process.
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In THz-TDS, various noise effects compromise signal quality; noise contributions include optical and electronic effects, laser intensity variations, and jitter noise.
“In THz-TDS, various noise effects compromise the signal quality [23 -25]. Noise contributions include optical and electronic effects [26, 27], laser intensity variations [28], and jitter noise [29, 30].”
From Terahertz-time domain spectrometer with 90 dB peak dynamic range (2014) · cites this paper as [25]
Jitter noise has an equally significant impact on the attainable SNR level.
“In this section, we are going to discuss the effect of jitter noise, which has an equally significant impact on the attainable SNR level [25, 29, 32, 33].”
From Terahertz-time domain spectrometer with 90 dB peak dynamic range (2014) · cites this paper as [25]
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References 23 · Cited by 29
- Authors
- Withayachumnankul, W., Lin, H., Mickan, S. P., Fischer, B. M., & Abbott, D.
- Affiliations
- The University of Adelaide (AU)
- Venue
- SPIE Proceedings
- Publisher
- SPIE
- Published
- 2007-05-18
- Volume
- 6593
- Pages
- 659326
- ISSN
- 0277-786X (ISSN-L)
- OpenAlex
- W2164650419
- Cited by
- 29
- References
- 23
- Citations by year
- 2025: 1 · 2024: 2 · 2023: 1 · 2022: 2 · 2021: 1 · 2019: 3 · 2017: 1 · 2016: 4 · 2015: 2 · 2014: 1 · 2013: 2 · 2012: 1
- FWCI
- 4.02
- Type
- conference paper
- Language
- en
- Open access
- closed
- Locations
- Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE (publishedVersion)
- Adelaide Research & Scholarship (AR&S) (University of Adelaide) (submittedVersion)
- Lancaster EPrints (Lancaster University) (submittedVersion)
- Topics
- Physical Sciences › Engineering › Electrical and Electronic Engineering › Terahertz technology and applications
- Social Sciences › Decision Sciences › Statistics, Probability and Uncertainty › Scientific Measurement and Uncertainty Evaluation
- Physical Sciences › Engineering › Electrical and Electronic Engineering › Microwave and Dielectric Measurement Techniques
- Keywords
- measurement uncertainty, terahertz time-domain spectroscopy, error propagation, optical constants, dielectric constant, material parameter identification, uncertainty sources
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