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Subatomic Features on the Silicon (111)-(7×7) Surface Observed by Atomic Force Microscopy
Open accessAbstract
The atomic force microscope images surfaces by sensing the forces between a sharp tip and a sample. If the tip-sample interaction is dominated by short-range forces due to the formation of covalent bonds, the image of an individual atom should reflect the angular symmetry of the interaction. Here, we report on a distinct substructure in the images of individual adatoms on silicon (111)-(7×7), two crescents with a spherical envelope. The crescents are interpreted as images of two atomic orbitals of the front atom of the tip. Key for the observation of these subatomic features is a force-detection scheme with superior noise performance and enhanced sensitivity to short-range forces.
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Citations
Cited by
Fukuma, T., Ueda, Y., Yoshioka, S., & Asakawa, H. (2010) · Physical Review Letters · doi:10.1103/physrevlett.104.016101 · Cited by 464
Giessibl, F. J. (2001) · Applied Physics Letters · doi:10.1063/1.1335546 · Cited by 323
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Metadata
- Authors
- Giessibl, F. J., Hembacher, S., Bielefeldt, H., & Mannhart, J.
- Venue
- Science
- Published
- 2000-07-21
- Volume
- 289
- Issue
- 5478
- Pages
- 422-425
- ISSN
- 0036-8075 (ISSN-L)
- 1095-9203
- OpenAlex
- W2171076894
- Cited by
- 396
- References
- 0
- FWCI
- 11.62
- Type
- journal article
- Language
- en
- Open access
- green
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- Giessibl, F. J., Hembacher, S., Bielefeldt, H., & Mannhart, J. (2000). Subatomic Features on the Silicon (111)-(7×7) Surface Observed by Atomic Force Microscopy. Science. https://doi.org/10.1126/science.289.5478.422
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Contains information from the Semantic Scholar Academic Graph Datasets, made available under the ODC Attribution License (ODC-BY 1.0).
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