The DOI matches its Crossref record; 5 of the 5 references it cites were found in a registry or an index.
A direct method to calculate tip–sample forces from frequency shifts in frequency-modulation atomic force microscopy
Abstract
Frequency-modulation atomic force microscopy (FMAFM) has proven to be a powerful method for imaging surfaces with true atomic resolution. However, the tip–sample forces are not directly accessible by FMAFM. Here, an algorithm to recover the tip–sample forces from the frequency shift curve is introduced and demonstrated with experimental data. Also, an intuititive connection between frequency shift Δf and tip–sample force gradient kts that simplifies the calculation of FMAFM images is established: Δf is a convolution of kts with a semispherical weight function.
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Citations
Cites
Binnig, G., Quate, C. F., & Gerber, C. (1986) · Physical Review Letters · doi:10.1103/physrevlett.56.930 · Cited by 14,762
Frequency modulation detection using high-Q cantilevers for enhanced force microscope sensitivity
Albrecht, T. R., Grütter, P., Horne, D., & Rugar, D. (1991) · Journal of Applied Physics · doi:10.1063/1.347347 · Cited by 2,434
Theory for the Forces between Closed-Shell Atoms and Molecules
Gordon, R. G., & Kim, Y. S. (1972) · The Journal of Chemical Physics · doi:10.1063/1.1677649 · Cited by 1,262
Subatomic Features on the Silicon (111)-(7×7) Surface Observed by Atomic Force Microscopy
Giessibl, F. J., Hembacher, S., Bielefeldt, H., & Mannhart, J. (2000) · Science · doi:10.1126/science.289.5478.422 · Cited by 396
Self-citationDirect mechanical measurement of interatomic potentials
Jarvis, S., Yamada, H., Yamamoto, S., Tokumoto, H., & Pethica, J. B. (1996) · Nature · doi:10.1038/384247a0 · Cited by 137
Cited by
Miyata, K., Tracey, J., Miyazawa, K., Haapasilta, V., Spijker, P., Kawagoe, Y., Foster, A. S., Tsukamoto, K., & Fukuma, T. (2017) · Nano Letters · doi:10.1021/acs.nanolett.7b00757 · Cited by 86
Monotonic Damping in Nanoscopic Hydration Experiments
Labuda, A., Kobayashi, K., Suzuki, K., Yamada, H., & Grütter, P. (2013) · Physical Review Letters · doi:10.1103/physrevlett.110.066102 · Cited by 38
Metadata
- Authors
- Giessibl, F. J.
- Venue
- Applied Physics Letters
- Publisher
- AIP Publishing
- Published
- 2001-01-01
- Volume
- 78
- Issue
- 1
- Pages
- 123-125
- ISSN
- 0003-6951 (ISSN-L)
- 1077-3118
- OpenAlex
- W2063838158
- Cited by
- 323
- References
- 5
- FWCI
- 5.89
- Type
- journal article
- Language
- en
- Open access
- closed
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- Giessibl, F. J. (2001). A direct method to calculate tip–sample forces from frequency shifts in frequency-modulation atomic force microscopy. Applied Physics Letters. https://doi.org/10.1063/1.1335546
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