The DOI matches its Crossref record; 28 of the 28 references it cites were found in a registry or an index.
Atomic-resolution transmission electron microscopy of electron beam–sensitive crystalline materials
Open accessAbstract
Crystallography of sensitive materials: High-resolution transmission electron microscopy is an invaluable tool for looking at the crystalline structures of many materials. However, the need for high beam doses, especially as a sample is rotated to find the crystal axes, can lead to damage, particularly in fragile materials. Zhang et al. combined a state-of-the-art direct-detection electron-counting camera with ways to limit the overall electron dose to analyze delicate materials such as metal organic frameworks. With this approach, they could see the benzene rings in a UiO-66 linker and the coexistence of ligand-free (metal-exposing) and ligand-capped surfaces in UiO-66 crystals. Science , this issue p. 675
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Cites
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Cited by
Nam, K. W., Park, S. S., dos Reis, R., Dravid, V. P., Kim, H., Mirkin, C. A., & Stoddart, J. F. (2019) · Nature Communications · doi:10.1038/s41467-019-12857-4 · Cited by 688
Metadata
- Authors
- Zhang, D., Zhu, Y., Liu, L., Ying, X., Hsiung, C.-E., Sougrat, R., Li, K., & Han, Y.
- Venue
- Science
- Published
- 2018-02-09
- Volume
- 359
- Issue
- 6376
- Pages
- 675-679
- ISSN
- 0036-8075 (ISSN-L)
- 1095-9203
- OpenAlex
- W2783895701
- Cited by
- 561
- References
- 28
- FWCI
- 23.72
- Type
- journal article
- Language
- en
- Open access
- green
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