Cited by 2Ferroelectric and Piezoelectric MaterialsFerroelectric and Negative Capacitance DevicesMultiferroics and related materials

Structural Features and Mutual Influence of the Layers in PZT–LNO–SiOx–Si and PZT–LNO–Si Compositions

Zhigalina, O. M., Atanova, A. V., Khmelenin, D. N., Kotova, N. M., Seregin, D. S., Vorotilov, K. A.·2019·Crystallography Reports

Abstract

The phase composition and specific features of the microstructures of layers in the Pb(Zr0.52Ti0.48)O3–LaNiO3–Si and Pb(Zr0.52Ti0.48)O3–LaNiO3–SiOx–Si compositions grown by chemical vapor deposition from solutions have been investigated by high-resolution transmission electron microscopy, electron diffraction, and energy-dispersive analysis. The influence of the structure of the lower LaNiO3 electrode on the structure and properties of ferroelectric lead zirconate titanate films with a perovskite structure is studied. It is shown that the misoriented porous polycrystalline structure of the lower electrode leads to violation of the columnarity of perovskite grains. The electrical parameters are slightly deteriorated in comparison with a conventional platinum electrode. The structures of the thin films with a silicate sublayer under the LaNiO3 electrode and without it are compared.

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Crossref · 10.1134/s1063774519060282

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Each is checked against this paper’s own text: does it say what the citing paper says it does?

  • In the equiaxed LNO case, a large amount of small and randomly oriented LNO crystallites causes the nucleation of many PZT crystallites that compete with each other.

    “In the last case, a large amount of small and randomly oriented LNO crystallites causes the nucleation of many PZT crystallites that are competing with each other.”

    From Control of Columnar Grain Microstructure in CSD LaNiO3 Films (2023) · cites this paper as [48]

  • In the equiaxed LNO case, many PZT grains do not grow through the entire film thickness.

    “As a result, many grains do not grow through the entire film thickness [48].”

    From Control of Columnar Grain Microstructure in CSD LaNiO3 Films (2023) · cites this paper as [48]

  • The columnar structure of PZT film on the columnar grain LNO layer is much more uniform than on LNO with the equiaxed grain structure.

    “The columnar structure of PZT film on the columnar grain LNO layer is much more uniform than on the LNO with the equiaxed grain structure [48].”

    From Control of Columnar Grain Microstructure in CSD LaNiO3 Films (2023) · cites this paper as [48]

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Authors
Zhigalina, O. M., Atanova, A. V., Khmelenin, D. N., Kotova, N. M., Seregin, D. S., & Vorotilov, K. A.
Affiliations
  • Russian Academy of Sciences (RU)
  • MIREA - Russian Technological University (RU)
Corresponding author
Zhigalina, O. M.
Venue
Crystallography Reports
Published
2019-11
Volume
64
Issue
6
Pages
961-967
ISSN
  • 1063-7745 (ISSN-L)
  • 1562-689X
OpenAlex
W2997613014
Cited by
2
References
0
Citations by year
2023: 1 · 2022: 1
FWCI
0.09
Type
journal article
Language
en
Open access
closed
Locations
Crystallography Reports (publishedVersion)
Topics
  • Physical Sciences › Materials Science › Materials Chemistry › Ferroelectric and Piezoelectric Materials
  • Physical Sciences › Engineering › Electrical and Electronic Engineering › Ferroelectric and Negative Capacitance Devices
  • Physical Sciences › Materials Science › Electronic, Optical and Magnetic Materials › Multiferroics and related materials
Keywords
PZT thin films, lead zirconate titanate, LaNiO3 electrodes, perovskite structure, ferroelectric thin films, electrode-film interface, electrical properties, platinum electrode comparison

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