The DOI matches its Crossref record; 1 of the 1 references it cites were found in a registry or an index.
FreeSpan: frequent pattern-projected sequential pattern mining
Abstract
Article FreeSpan: frequent pattern-projected sequential pattern mining Share on Authors: Jiawei Han Intelligent Database Systems Research Lab. School of Computing Science, Simon Fraser University, Burnaby, B.C., Canada V5A 1S6 Intelligent Database Systems Research Lab. School of Computing Science, Simon Fraser University, Burnaby, B.C., Canada V5A 1S6View Profile , Jian Pei Intelligent Database Systems Research Lab. School of Computing Science, Simon Fraser University, Burnaby, B.C., Canada V5A 1S6 Intelligent Database Systems Research Lab. School of Computing Science, Simon Fraser University, Burnaby, B.C., Canada V5A 1S6View Profile , Behzad Mortazavi-Asl Intelligent Database Systems Research Lab. School of Computing Science, Simon Fraser University, Burnaby, B.C., Canada V5A 1S6 Intelligent Database Systems Research Lab. School of Computing Science, Simon Fraser University, Burnaby, B.C., Canada V5A 1S6View Profile , Qiming Chen Hewlett-Packard Labs. 1501 Page Mills Road, P.O. Box 10490, Palo Alto, California Hewlett-Packard Labs. 1501 Page Mills Road, P.O. Box 10490, Palo Alto, CaliforniaView Profile , Umeshwar Dayal Hewlett-Packard Labs. 1501 Page Mills Road, P.O. Box 10490, Palo Alto, California Hewlett-Packard Labs. 1501 Page Mills Road, P.O. Box 10490, Palo Alto, CaliforniaView Profile , Mei-Chun Hsu Hewlett-Packard Labs. 1501 Page Mills Road, P.O. Box 10490, Palo Alto, California Hewlett-Packard Labs. 1501 Page Mills Road, P.O. Box 10490, Palo Alto, CaliforniaView Profile Authors Info & Claims KDD '00: Proceedings of the sixth ACM SIGKDD international conference on Knowledge discovery and data miningAugust 2000 Pages 355–359https://doi.org/10.1145/347090.347167Online:01 August 2000Publication History 503citation3,103DownloadsMetricsTotal Citations503Total Downloads3,103Last 12 Months105Last 6 weeks11 Get Citation AlertsNew Citation Alert added!This alert has been successfully added and will be sent to:You will be notified whenever a record that you have chosen has been cited.To manage your alert preferences, click on the button below.Manage my AlertsNew Citation Alert!Please log in to your account Save to BinderSave to BinderCreate a New BinderNameCancelCreateExport CitationPublisher SiteGet Access
Overview
The claims and statistics of this paper haven’t been checked yet.
Run the check — free, no account needed. It reads the open-access text and checks the sources it cites.
Integrity signals
Registry
Cites
Statistics
Verification
Claims the paper makes
The claims and statistics of this paper haven’t been checked yet.
Run the check — free, no account needed. It reads the open-access text and checks the sources it cites.
Self-check
Percentages, sums and reported differences re-computed from the paper’s own numbers.
The self-check needs the paper’s full text.
Citations
Cites
Mining frequent patterns without candidate generation
Han, J., Pei, J., & Yin, Y. (2000) · ACM SIGMOD Record · doi:10.1145/335191.335372 · Cited by 6,402
Self-citation
Cited by
Data mining: concepts and techniques
(2012) · Choice Reviews Online · doi:10.5860/choice.49-3305 · Cited by 28,531
A taxonomy of sequential pattern mining algorithms
Mabroukeh, N. R., & Ezeife, C. I. (2010) · ACM Computing Surveys · doi:10.1145/1824795.1824798 · Cited by 400
Sequential pattern mining -- approaches and algorithms
Mooney, C. H., & Roddick, J. F. (2013) · ACM Computing Surveys · doi:10.1145/2431211.2431218 · Cited by 310
Clustering and Sequential Pattern Mining of Online Collaborative Learning Data
Perera, D., Kay, J., Koprinska, I., Yacef, K., & Zaiane, O. R. (2009) · IEEE Transactions on Knowledge and Data Engineering · doi:10.1109/tkde.2008.138 · Cited by 295
Mining frequent patterns by pattern-growth: methodology and implications
Han, J., & Pei, J. (2000) · ACM SIGKDD Explorations Newsletter · doi:10.1145/380995.381002 · Cited by 280
Self-citation
Metadata
- Authors
- Han, J., Pei, J., Mortazavi-Asl, B., Chen, Q., Dayal, U., & Hsu, M.-C.
- Venue
- Proceedings of the sixth ACM SIGKDD international conference on Knowledge discovery and data mining
- Publisher
- ACM
- Published
- 2000-08
- Pages
- 355-359
- OpenAlex
- W1990800901
- Cited by
- 808
- References
- 1
- FWCI
- 16.31
- Type
- conference paper
- Language
- en
- Open access
- closed
About these checks
Registry, retraction, Cites and statistics results are computed, not judged, with one exception: a printed reference that no index lists is read once by a model before it counts as a citation error. Claims are extracted by a model and kept only when their quote appears verbatim in the text; each cited source is then checked, with a model’s help, for whether it says what the claim relies on. Those verdicts can be wrong — read the claim’s quote and the cited source before relying on one.
Statistics and arithmetic are recomputed, not judged.
Confidence bands are shown only for fields calibrated on our annotated test set. None is calibrated yet, so no band is shown.
What counts as a claim ›How we measure confidence ›How we check this ›
Are you an author, or do you see a problem with this page? Request a review
How to cite
Cite CoChat for the checks on this page, and the paper for its own findings.
- This page
- CoChat. (2026). Citation check: FreeSpan: frequent pattern-projected sequential pattern mining. https://app.cochat.ai/papers/10.1145/347090.347167
- The paper
- Han, J., Pei, J., Mortazavi-Asl, B., Chen, Q., Dayal, U., & Hsu, M.-C. (2000). FreeSpan: frequent pattern-projected sequential pattern mining. Proceedings of the sixth ACM SIGKDD international conference on Knowledge discovery and data mining. https://doi.org/10.1145/347090.347167
Data sources
Bibliographic data: Semantic Scholar, OpenAlex, Crossref.
Contains information from the Semantic Scholar Academic Graph Datasets, made available under the ODC Attribution License (ODC-BY 1.0).
Semantic Scholar’s data is described in: Kinney, R., et al. (2023). The Semantic Scholar Open Data Platform. arXiv:2301.10140.
