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Cited by 168

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Field testing for cosmic ray soft errors in semiconductor memories

O'Gorman, T. J., Ross, J. M., Taber, A. H., Ziegler, J. F., Muhlfeld, H. P., Montrose, C. J., Curtis, H. W., Walsh, J. L.·1996·IBM Journal of Research and Development

Abstract

This paper presents a review of experiments performed by IBM to investigate the causes of soft errors in semiconductor memory chips under field test conditions. The effects of alpha-particles and cosmic rays are separated by comparing multiple measurements of the soft-error rate (SER) of samples of memory chips deep underground and at various altitudes above the earth. The results of case studies on four different memory chips show that cosmic rays are an important source of the ionizing radiation that causes soft errors. The results of field testing are used to confirm the accuracy of the modeling and the accelerated testing of chips.

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Metadata

Authors
O'Gorman, T. J., Ross, J. M., Taber, A. H., Ziegler, J. F., Muhlfeld, H. P., Montrose, C. J., Curtis, H. W., & Walsh, J. L.
Venue
IBM Journal of Research and Development
Publisher
IBM
Published
1996-01
Volume
40
Issue
1
Pages
41-50
ISSN
0018-8646 (ISSN-L)
OpenAlex
W2021548867
Cited by
168
References
0
FWCI
7.28
Type
journal article
Language
en
Open access
closed

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CoChat. (2026). Citation check: Field testing for cosmic ray soft errors in semiconductor memories. https://app.cochat.ai/papers/10.1147/rd.401.0041
The paper
O'Gorman, T. J., Ross, J. M., Taber, A. H., Ziegler, J. F., Muhlfeld, H. P., Montrose, C. J., Curtis, H. W., & Walsh, J. L. (1996). Field testing for cosmic ray soft errors in semiconductor memories. IBM Journal of Research and Development. https://doi.org/10.1147/rd.401.0041

Data sources

Bibliographic data: Semantic Scholar, OpenAlex, Crossref.

Contains information from the Semantic Scholar Academic Graph Datasets, made available under the ODC Attribution License (ODC-BY 1.0).

Semantic Scholar’s data is described in: Kinney, R., et al. (2023). The Semantic Scholar Open Data Platform. arXiv:2301.10140.