The DOI matches its Crossref record; 9 of the 9 references it cites were found in a registry or an index.
Single event upset at ground level
Abstract
Ground level upsets have been observed in computer systems containing large amounts of random access memory (RAM). Atmospheric neutrons are most likely the major cause of the upsets based on measured data using the Weapons Neutron Research (WNR) neutron beam.
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Citations
Cites
Johnson, A. P. (2024) · Being and Becoming Teachers of Writing · doi:10.4324/9781003334798-34 · Cited by 4,502
Single-event effects in avionics
Normand, E. (1996) · IEEE Transactions on Nuclear Science · doi:10.1109/23.490893 · Cited by 420
Self-citationEffect of Cosmic Rays on Computer Memories
Ziegler, J. F., & Lanford, W. A. (1979) · Science · doi:10.1126/science.206.4420.776 · Cited by 409
A New Physical Mechanism for Soft Errors in Dynamic Memories
May, T. C., & Woods, M. H. (1978) · 16th International Reliability Physics Symposium · doi:10.1109/irps.1978.362815 · Cited by 239
Field testing for cosmic ray soft errors in semiconductor memories
O'Gorman, T. J., Ross, J. M., Taber, A. H., Ziegler, J. F., Muhlfeld, H. P., Montrose, C. J., Curtis, H. W., & Walsh, J. L. (1996) · IBM Journal of Research and Development · doi:10.1147/rd.401.0041 · Cited by 168
Boron compounds as a dominant source of alpha particles in semiconductor devices
Baumann, R., Hossain, T. Z., Murata, S., et al. (1995) · IEEE International Reliability Physics Symposium proceedings · doi:10.1109/relphy.1995.513695 · Cited by 110
O'Brien, K., Sandmeier, H. A., Hansen, G. E., & Campbell, J. E. (1978) · Journal of Geophysical Research Atmospheres · doi:10.1029/ja083ia01p00114 · Cited by 77
Guidelines for predicting single-event upsets in neutron environments (RAM devices)
Letaw, J. R., & Normand, E. (1991) · IEEE Transactions on Nuclear Science · doi:10.1109/23.124138 · Cited by 75
Self-citationAltitude Variation of Cosmic-ray Neutrons
Nakamura, T., Uwamino, Y., Ohkubo, T., & Hara, A. (1987) · Health Physics · doi:10.1097/00004032-198711000-00008 · Cited by 64
Cited by
Soft Errors in Advanced Computer Systems
Baumann, R. (2005) · IEEE Design and Test of Computers · doi:10.1109/mdt.2005.69 · Cited by 831
Mukherjee, S. S., Weaver, C., Emer, J., Reinhardt, S. K., & Austin, T. (2004) · 22nd Digital Avionics Systems Conference. Proceedings (Cat. No.03CH37449) · doi:10.1109/micro.2003.1253181 · Cited by 656
DRAM errors in the wild: a large-scale field study
Schroeder, B., Pinheiro, E., & Weber, W.-D. (2009) · Proceedings of the eleventh international joint conference on Measurement and modeling of computer systems · doi:10.1145/1555349.1555372 · Cited by 557
Soft errors in advanced semiconductor devices-part I: the three radiation sources
Baumann, R. C. (2001) · IEEE Transactions on Device and Materials Reliability · doi:10.1109/7298.946456 · Cited by 414
Baumann, R. (2003) · Digest. International Electron Devices Meeting, · doi:10.1109/iedm.2002.1175845 · Cited by 318
Metadata
- Authors
- Normand, E.
- Venue
- IEEE Transactions on Nuclear Science
- Published
- 1996-12
- Volume
- 43
- Issue
- 6
- Pages
- 2742-2750
- ISSN
- 0018-9499 (ISSN-L)
- 1558-1578
- OpenAlex
- W2116097016
- Cited by
- 620
- References
- 9
- FWCI
- 7.28
- Type
- journal article
- Language
- en
- Open access
- closed
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- Normand, E. (1996). Single event upset at ground level. IEEE Transactions on Nuclear Science. https://doi.org/10.1109/23.556861
Data sources
Bibliographic data: Semantic Scholar, OpenAlex, Crossref.
Contains information from the Semantic Scholar Academic Graph Datasets, made available under the ODC Attribution License (ODC-BY 1.0).
Semantic Scholar’s data is described in: Kinney, R., et al. (2023). The Semantic Scholar Open Data Platform. arXiv:2301.10140.
