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Terrestrial cosmic ray intensities

Ziegler, J. F.·1998·IBM Journal of Research and Development

Abstract

Cosmic rays may cause soft fails in electronic logic or memory. The IBM Journal of Research and Development, Volume 40, No. 1, discussed this complex event in detail. In order to predict electronic fail rates from cosmic particles, it is necessary to know the local cosmic ray flux. This paper reviews the penetration of cosmic rays through the earth's atmosphere, and the parameters which affect the terrestrial flux. The final particle flux is shown to vary mainly with the site's geomagnetic coordinates and its altitude. The paper describes in detail the quantitative cosmic flux at one datum (New York City) and then tabulates in an appendix the relative level at other major cities of the world.

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Metadata

Authors
Ziegler, J. F.
Venue
IBM Journal of Research and Development
Publisher
IBM
Published
1998-01
Volume
42
Issue
1
Pages
117-140
ISSN
0018-8646 (ISSN-L)
OpenAlex
W1975157752
Cited by
247
References
0
FWCI
3.40
Type
journal article
Language
en
Open access
closed

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CoChat. (2026). Citation check: Terrestrial cosmic ray intensities. https://app.cochat.ai/papers/10.1147/rd.421.0117
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Ziegler, J. F. (1998). Terrestrial cosmic ray intensities. IBM Journal of Research and Development. https://doi.org/10.1147/rd.421.0117

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Bibliographic data: Semantic Scholar, OpenAlex, Crossref.

Contains information from the Semantic Scholar Academic Graph Datasets, made available under the ODC Attribution License (ODC-BY 1.0).

Semantic Scholar’s data is described in: Kinney, R., et al. (2023). The Semantic Scholar Open Data Platform. arXiv:2301.10140.