The DOI matches its Crossref record; 2 of the 2 references it cites were found in a registry or an index.
Overview of candidate device technologies for storage-class memory
Abstract
Storage-class memory (SCM) combines the benefits of a solid-state memory, such as high performance and robustness, with the archival capabilities and low cost of conventional hard-disk magnetic storage. Such a device would require a solid-state nonvolatile memory technology that could be manufactured at an extremely high effective areal density using some combination of sublithographic patterning techniques, multiple bits per cell, and multiple layers of devices. We review the candidate solid-state nonvolatile memory technologies that potentially could be used to construct such an SCM. We discuss evolutionary extensions of conventional flash memory, such as SONOS (silicon-oxide-nitride-oxide-silicon) and nanotraps, as well as a number of revolutionary new memory technologies. We review the capabilities of ferroelectric, magnetic, phase-change, and resistive random-access memories, including perovskites and solid electrolytes, and finally organic and polymeric memory. The potential for practical scaling to ultrahigh effective areal density for each of these candidate technologies is then compared.
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Citations
Cites
Nanoscale Memory Elements Based on Solid-State Electrolytes
Kozicki, M. N., Park, M., & Mitkova, M. (2005) · IEEE Transactions On Nanotechnology · doi:10.1109/tnano.2005.846936 · Cited by 540 · cited 1×
“and very high endurance [70] have been successfully”
BackgroundA model for filament growth and switching in amorphous oxide films
Dearnaley, G., Morgan, D. V., & Stoneham, A. M. (1970) · Journal of Non-Crystalline Solids · doi:10.1016/0022-3093(70)90097-9 · Cited by 289
Cited by
Atomic structure of conducting nanofilaments in TiO2 resistive switching memory
Kwon, D.-H., Kim, K. M., Jang, J. H., Jeon, J. M., Lee, M. H., Kim, G. H., Li, X.-S., Park, G.-S., Lee, B., Han, S., et al. (2010) · Nature Nanotechnology · doi:10.1038/nnano.2009.456 · Cited by 2,092
Block copolymer based nanostructures: Materials, processes, and applications to electronics
Kim, H.-C., Park, S.-M., & Hinsberg, W. D. (2010) · Chemical Reviews · doi:10.1021/cr900159v · Cited by 1,017
Phase change memory technology
Burr, G. W., Breitwisch, M. J., Franceschini, M., Garetto, D., Gopalakrishnan, K., Jackson, B., Kurdi, B., Lam, C., Lastras, L. A., Padilla, A., et al. (2010) · Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena · doi:10.1116/1.3301579 · Cited by 916
Self-citationPhase Change Materials and Their Application to Nonvolatile Memories
Raoux, S., Wełnic, W., & Ielmini, D. (2010) · Chemical Reviews · doi:10.1021/cr900040x · Cited by 873
Memory effects in complex materials and nanoscale systems
Pershin, Y. V., & Di Ventra, M. (2011) · Advances In Physics · doi:10.1080/00018732.2010.544961 · Cited by 823
Metadata
- Authors
- Burr, G. W., Kurdi, B. N., Scott, J. C., Lam, C. H., Gopalakrishnan, K., & Shenoy, R. S.
- Venue
- IBM Journal of Research and Development
- Publisher
- IBM
- Published
- 2008-07
- Volume
- 52
- Issue
- 4.5
- Pages
- 449-464
- ISSN
- 0018-8646 (ISSN-L)
- OpenAlex
- W2006798699
- Cited by
- 687
- References
- 2
- FWCI
- 49.93
- Type
- journal article
- Language
- en
- Open access
- closed
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- Burr, G. W., Kurdi, B. N., Scott, J. C., Lam, C. H., Gopalakrishnan, K., & Shenoy, R. S. (2008). Overview of candidate device technologies for storage-class memory. IBM Journal of Research and Development. https://doi.org/10.1147/rd.524.0449
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