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A Point Defect Model for Anodic Passive Films: I . Film Growth Kinetics

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Chao, C. Y., Lin, L. F., Macdonald, D. D.·1981·Journal of The Electrochemical Society

Abstract

A model based on the movement of point defects in an electrostatic field is proposed to interpret the growth behavior of a passive film on a metal surface. This model results in a logarithmic growth law. The theoretical equations derived from the model readily account for experimental data for the growth of a passive film on iron. It is found that the field strength of the film is . The dependence of film/solution interface potential difference on the applied potential (α) was found to be 0.743, and is independent of the identity of the anion in solution. However, the dependence of the potential difference across the film/solution interface on the solution p H (β) is strongly dependent on the identity of the solution anion.

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Metadata

Authors
Chao, C. Y., Lin, L. F., & Macdonald, D. D.
Venue
Journal of The Electrochemical Society
Published
1981-06-01
Volume
128
Issue
6
Pages
1187-1194
ISSN
  • 0013-4651 (ISSN-L)
  • 1945-7111
OpenAlex
W1484595209
Cited by
894
References
0
FWCI
4.60
Type
journal article
Language
en
Open access
bronze

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CoChat. (2026). Citation check: A Point Defect Model for Anodic Passive Films: I . Film Growth Kinetics. https://app.cochat.ai/papers/10.1149/1.2127591
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Chao, C. Y., Lin, L. F., & Macdonald, D. D. (1981). A Point Defect Model for Anodic Passive Films: I . Film Growth Kinetics. Journal of The Electrochemical Society. https://doi.org/10.1149/1.2127591

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Contains information from the Semantic Scholar Academic Graph Datasets, made available under the ODC Attribution License (ODC-BY 1.0).

Semantic Scholar’s data is described in: Kinney, R., et al. (2023). The Semantic Scholar Open Data Platform. arXiv:2301.10140.