The DOI matches its Crossref record.
Physics of Thin Films
Abstract
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Citations
Cited by
GaAs, AlAs, and Al x Ga1−x As: Material parameters for use in research and device applications
Adachi, S. (1985) · Journal of Applied Physics · doi:10.1063/1.336070 · Cited by 3,289
Ionized physical vapor deposition (IPVD): A review of technology and applications
Helmersson, U., Lattemann, M., Bohlmark, J., Ehiasarian, A. P., & Gudmundsson, J. T. (2006) · Thin Solid Films · doi:10.1016/j.tsf.2006.03.033 · Cited by 1,081
Nanofabricated media with negative permeability at visible frequencies
Grigorenko, A. N., Geim, A. K., Gleeson, H. F., Zhang, Y., Firsov, A. A., Khrushchev, I. Y., & Petrovic, J. (2005) · Nature · doi:10.1038/nature04242 · Cited by 616
Effect of low earth orbit atomic oxygen on spacecraft materials
Reddy, M. R. (1995) · Journal of Materials Science · doi:10.1007/bf00354389 · Cited by 331
A global (volume averaged) model of a nitrogen discharge: I. Steady state
Thorsteinsson, E. G., & Gudmundsson, J. T. (2009) · Plasma Sources Science and Technology · doi:10.1088/0963-0252/18/4/045001 · Cited by 132
Metadata
- Authors
- Hass, G., & Gerstenberg, D.
- Venue
- Journal of The Electrochemical Society
- Publisher
- The Electrochemical Society
- Published
- 1964
- Volume
- 111
- Issue
- 3
- Pages
- 85C
- ISSN
- 0013-4651 (ISSN-L)
- OpenAlex
- W2036371710
- Cited by
- 1,754
- References
- 0
- FWCI
- 11.80
- Type
- journal article
- Language
- en
- Open access
- closed
About these checks
Registry, retraction, Cites and statistics results are computed, not judged, with one exception: a printed reference that no index lists is read once by a model before it counts as a citation error. Claims are extracted by a model and kept only when their quote appears verbatim in the text; each cited source is then checked, with a model’s help, for whether it says what the claim relies on. Those verdicts can be wrong — read the claim’s quote and the cited source before relying on one.
Statistics and arithmetic are recomputed, not judged.
Confidence bands are shown only for fields calibrated on our annotated test set. None is calibrated yet, so no band is shown.
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How to cite
Cite CoChat for the checks on this page, and the paper for its own findings.
- This page
- CoChat. (2026). Citation check: Physics of Thin Films. https://app.cochat.ai/papers/10.1149/1.2426128
- The paper
- Hass, G., & Gerstenberg, D. (1964). Physics of Thin Films. Journal of The Electrochemical Society. https://doi.org/10.1149/1.2426128
Data sources
Bibliographic data: Semantic Scholar, OpenAlex, Crossref.
Contains information from the Semantic Scholar Academic Graph Datasets, made available under the ODC Attribution License (ODC-BY 1.0).
Semantic Scholar’s data is described in: Kinney, R., et al. (2023). The Semantic Scholar Open Data Platform. arXiv:2301.10140.
