Cited by 6Industrial Vision Systems and Defect DetectionNon-Destructive Testing TechniquesInfrastructure Maintenance and Monitoring

Defect Classification Recognition on Strip Steel Surface Using Second-Order Cone Programming-Relevance Vector Machine Algorithm

Dongyan, Cui, Kewen, Xia, Aslam, Nelofar, Jingzhong, Hou·2016·Journal of Computational and Theoretical Nanoscience

Integrity signals

Registry

Crossref · 10.1166/jctn.2016.5539

Cites

Statistics

Recomputing p-values needs the paper’s full text.

Claims the paper makes

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Cited by

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Authors
Dongyan, C., Kewen, X., Aslam, N., & Jingzhong, H.
Affiliations
  • School of Electronics and Information Engineering, Hebei University of Technology, Tianjin, 300401, China
  • Hebei University of Technology (CN)
Venue
Journal of Computational and Theoretical Nanoscience
Published
2016-09-01
Volume
13
Issue
9
Pages
6141-6148
ISSN
1546-1955 (ISSN-L)
OpenAlex
W2581023882
Cited by
6
References
0
Citations by year
2024: 1 · 2023: 1 · 2022: 2 · 2020: 1 · 2018: 1
FWCI
0.45
Type
journal article
Language
en
Open access
closed
Locations
Journal of Computational and Theoretical Nanoscience (publishedVersion)
Topics
  • Physical Sciences › Engineering › Industrial and Manufacturing Engineering › Industrial Vision Systems and Defect Detection
  • Physical Sciences › Engineering › Mechanical Engineering › Non-Destructive Testing Techniques
  • Physical Sciences › Engineering › Civil and Structural Engineering › Infrastructure Maintenance and Monitoring
Keywords
defect classification, second-order cone programming, relevance vector machine, steel quality inspection

About these checks

Registry, retraction, Cites and statistics results are computed, not judged, with one exception: a printed reference that no index lists is read once by a model before it counts as a citation error. Claims are extracted by a model and kept only when their quote appears verbatim in the text; each cited source is then checked, with a model’s help, for whether it says what the claim relies on. Those verdicts can be wrong — read the claim’s quote and the cited source before relying on one.

Statistics and arithmetic are recomputed, not judged.

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